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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)
11 May 2011 | Online Presentations | Contributor(s): Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10...
NanoV: Nanowire-based VLSI Design
08 Sep 2010 | Downloads | Contributor(s): muzaffer simsir
In the coming decade, CMOS technology is expected to approach its scaling limitations. Among the proposed nanotechnologies, nanowires have the edge in the size of circuits and logic arrays that...
ECE 612 Lecture 23: RF CMOS
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02 Dec 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) Introduction,
2) Small signal model,
5) Gain bandwidth product,
6) Unity power gain,
7) Noise, mismatch, linearity…,
ECE 612 Lecture 22: CMOS Circuit Essentials
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24 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) The CMOS inverter,
4) Circuit performance,
This lecture is an overview of CMOS circuits. For a more detailed presentation, the...
ECE 612 Lecture 18B: CMOS Process Flow
18 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom
For a basic, CMOS process flow for an STI (shallow trench isolation process), see: http://www.rit.edu/~lffeee/AdvCmos2003.pdf.
This lecture is a condensed version of the more complete...
ECE 612 Lecture 18A: CMOS Process Steps
12 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) Unit Process Operations,
2) Process Variations.