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[Illinois] ECE 416 Lecture 12: Glucose Sensor I
27 Feb 2013 | Online Presentations | Contributor(s): Brian Cunningham
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https://nanohub.org/resources/16947
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[Illinois] ECE 416 Lecture 13: Glucose Sensor II
27 Feb 2013 | Online Presentations | Contributor(s): Brian Cunningham
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https://nanohub.org/resources/16948
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[Illinois] ECE 416 Lecture 14: Acoustic Wave Sensors
27 Feb 2013 | Online Presentations | Contributor(s): Brian Cunningham
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https://nanohub.org/resources/16949
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[Illinois] ECE 416 Lecture 15: Surface Plasmon Resonance (SPR) Sensors I
27 Feb 2013 | Online Presentations | Contributor(s): Brian Cunningham
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https://nanohub.org/resources/16956
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[Illinois] ECE 416 Lecture 10: Mass Transport II
26 Feb 2013 | Online Presentations | Contributor(s): Brian Cunningham
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https://nanohub.org/resources/16945
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[Illinois] ECE 416 Lecture 8: Bio Structure/Function II + Mass Transport I
26 Feb 2013 | Online Presentations | Contributor(s): Brian Cunningham
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https://nanohub.org/resources/16943
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[Illinois] ECE 416 Lecture 9: Assay Formats
26 Feb 2013 | Online Presentations | Contributor(s): Brian Cunningham
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https://nanohub.org/resources/16944
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PHYS 620 Lecture 6: Valence Band: Spin-Orbit Coupling and Stress Effects
25 Feb 2013 | Online Presentations | Contributor(s): Roberto Merlin
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https://nanohub.org/resources/16825
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PHYS 620 Lecture 11: Excitons II
25 Feb 2013 | Online Presentations | Contributor(s): Roberto Merlin
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https://nanohub.org/resources/16830
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ECE 695A Lecture 18: DC-IV and Charge Pumping Methods
25 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Recall: Properties of Interface Defects Flux-based method 1: Direct Current-Voltage method Flux-based method 2: Charge pumping method Conclusions
https://nanohub.org/resources/17023
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ECE 695A Lecture 16: Review Questions
22 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Question What is the difference between hot atom dissociation vs. cold atom dissociation?. Many experiments are reported at 77K and 295K. Why these temperatures?. Why is there such a …
https://nanohub.org/resources/17014
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ECE 695A Lecture 17: Subtheshold and Idlin Methods
21 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
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https://nanohub.org/resources/16965
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ECE 595E Lecture 16: Applications of the Beam Propagation Method I
21 Feb 2013 | Online Presentations | Contributor(s): Peter Bermel
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https://nanohub.org/resources/16898
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ECE 695A Lecture 15R: Review Questions
20 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions: Why is BTBT tunneling important for OFF-state HCI, but nor for ON-state HCI? What type of bond dissociation dominated DeMOS degradation? Provide two supporting arguments. …
https://nanohub.org/resources/16933
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ECE 695A Lecture 14a: Voltage Dependent HCI I
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Background and Empirical Observations Theory of Hot Carriers: Hydrodynamic Model Theory of Hot Carriers: Monte Carlo Model Theory of Hot Carriers: Universal Scaling Conclusion …
https://nanohub.org/resources/16895
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ECE 695A Lecture 14b: Voltage Dependent HCI II
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Background and Empirical Observations Theory of Hot Carriers: Hydrodynamic Model Theory of Hot Carriers: Monte Carlo Model Theory of Hot Carriers: Universal Scaling Conclusion …
https://nanohub.org/resources/16896
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ECE 695A Lecture 14R: Review Questions
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions Why is Isub called a thermometer of hot electron distribution? Why can you not simply measure hot electrons by looking at the drain current? What are the three methods of HCI …
https://nanohub.org/resources/16897
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ECE 695A Lecture 15: Off-state HCI Degradation
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: ON vs. OFF State HCI Degradation Origin of hot carriers at off-state SiH vs. SiO – who is getting broken? Voltage acceleration factors by scaling Conclusions
https://nanohub.org/resources/16919
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ECE 695A Lecture 16: Temperature Dependence of HCI
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Empirical observations regarding HCI Theory of bond dissociation: MVE vs. RRK Hot carrier dissociation of SiH bonds Hot carrier dissociation of SiO bonds Conclusions
https://nanohub.org/resources/16920
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ECE 595E Lecture 15: Beam Propagation Method II
19 Feb 2013 | Online Presentations | Contributor(s): Peter Bermel
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https://nanohub.org/resources/16842