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Tags: CV curves

Resources (1-20 of 22)

  1. CV profile with different oxide thickness

    20 Apr 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck

    C-V (or capacitance-voltage) profiling refers to a technique used for the characterization of semiconductor materials and devices. C-V testing is often used during the characterization process to...

    http://nanohub.org/resources/8818

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