ECE 695A Lecture 17R: Review Questions

01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

Review Questions: What is wrong with using C-V measurement methods exclusively for NBTI and HCI degradation? Why do people like to use C-V techniques? What method would you use for HCI …

https://nanohub.org/resources/17155

ECE 606 Lecture 22: MOScap Frequence Response/MOSFET I-V Characteristics

26 Nov 2012 | Online Presentations | Contributor(s): Gerhard Klimeck

…

https://nanohub.org/resources/15977

Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

24 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

https://nanohub.org/resources/10521

Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

Introduction to Device Characterization - System Overview: System Architecture, Hardware Features and Software Features - Precision DC I-V Source-Measure Features and Concepts.

https://nanohub.org/resources/10387

Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

https://nanohub.org/resources/10388

Keithley 4200-SCS Lecture 03: More KITE Setup and Features

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

https://nanohub.org/resources/10389

Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

https://nanohub.org/resources/10390

Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

https://nanohub.org/resources/10391

Keithley 4200-SCS Lecture 06: Troubleshooting

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

https://nanohub.org/resources/10392

Keithley 4200-SCS Lecture 07: KCON Utility Overview

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

https://nanohub.org/resources/10430

Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

Theory of Operation and Measurement Overview

https://nanohub.org/resources/10431

Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

Measurement Techniques and Optimization

https://nanohub.org/resources/10432

Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

Measurement Techniques and Optimization

https://nanohub.org/resources/10433

Keithley 4200-SCS: KITE Demo

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

https://nanohub.org/resources/10429

Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

https://nanohub.org/resources/10480

Device Characterization with the Keithley 4200-SCS

20 Jan 2011 | Courses | Contributor(s): Lee Stauffer

This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as …

https://nanohub.org/resources/10386

CV profile with different oxide thickness

20 Apr 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck

C-V (or capacitance-voltage) profiling refers to a technique used for the characterization of semiconductor materials and devices. C-V testing is often used during the characterization process to …

https://nanohub.org/resources/8818

Illinois ECE 440: MOS Capacitor Homework

28 Jan 2010 | Teaching Materials | Contributor(s): Mohamed Mohamed

This homework covers Threshold Voltage, MOS Band Diagram, and MOS Capacitance-Voltage Analysis.

https://nanohub.org/resources/8266

schred running ok?

Closed | Responses: 0

The CV for very thin oxide (considering only G vs considering GLX) on GaAs seems to be exactly similar. Which is surprising. can anyone check wheather schred is running properly or not?

https://nanohub.org/answers/question/387

Exercise for MOS Capacitors: CV curves and interface and Oxide Charges

03 Aug 2009 | Teaching Materials | Contributor(s): Dragica Vasileska, Gerhard Klimeck

This exercise is designed to teach the students how the CV curves of an ideal MOS Capacitor change in the presence of oxide or interface charges.

https://nanohub.org/resources/7186