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Tags: CV curves

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  1. MEMSLab

    05 Jun 2013 | Tools | Contributor(s): Oluwatosin Adeosun, Sambit Palit, Ankit Jain, Muhammad Alam, Xin Jin

    Simulation suite for electromechanical actuators

    http://nanohub.org/resources/cvgraph

  2. ECE 695A Lecture 17R: Review Questions

    01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is wrong with using C-V measurement methods exclusively for NBTI and HCI degradation? Why do people like to use C-V techniques? What method would you use for HCI...

    http://nanohub.org/resources/17155

  3. ECE 606 Lecture 22: MOScap Frequence Response/MOSFET I-V Characteristics

    26 Nov 2012 | Online Presentations | Contributor(s): Gerhard Klimeck

    http://nanohub.org/resources/15977

  4. Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

    24 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10521

  5. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Introduction to Device Characterization - System Overview: System Architecture, Hardware Features and Software Features - Precision DC I-V Source-Measure Features and Concepts.

    http://nanohub.org/resources/10387

  6. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10388

  7. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10389

  8. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10390

  9. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10391

  10. Keithley 4200-SCS Lecture 06: Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10392

  11. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10430

  12. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Theory of Operation and Measurement Overview

    http://nanohub.org/resources/10431

  13. Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    http://nanohub.org/resources/10432

  14. Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    http://nanohub.org/resources/10433

  15. Keithley 4200-SCS: KITE Demo

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10429

  16. Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10480

  17. Device Characterization with the Keithley 4200-SCS

    20 Jan 2011 | Courses | Contributor(s): Lee Stauffer

    This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument,...

    http://nanohub.org/resources/10386

  18. CV profile with different oxide thickness

    20 Apr 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck

    C-V (or capacitance-voltage) profiling refers to a technique used for the characterization of semiconductor materials and devices. C-V testing is often used during the characterization process to...

    http://nanohub.org/resources/8818

  19. Illinois ECE 440: MOS Capacitor Homework

    28 Jan 2010 | Teaching Materials | Contributor(s): Mohamed Mohamed

    This homework covers Threshold Voltage, MOS Band Diagram, and MOS Capacitance-Voltage Analysis.

    http://nanohub.org/resources/8266

  20. schred running ok?

    Closed | Responses: 0

    The CV for very thin oxide (considering only G vs considering GLX) on GaAs seems to be exactly similar. Which...

    http://nanohub.org/answers/question/387

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