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Tags: Defect

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  1. Theory and characterization of random defect formation and its implication in variability of nanoscale transistors

    30 Sep 2011 | Publications | Contributor(s): Ahmad Ehteshamul Islam

    Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of...

    http://nanohub.org/resources/12182

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