Tags: defects

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  1. ME 290R Lecture 2.1: Lithography Performance Criteria - Technical

    27 Mar 2019 | | Contributor(s):: Taylor, Hayden

    Ways to evaluate a lithography process. Topics include: resolution; line edge roughness; overlay capability; throughput; cost of ownership; capital cost; energy consumption and environmental impact (e.g. solvent usage; material wastage); pattern dependencies.

  2. ME 290R Lecture 2.2: Lithography Performance Criteria - Technical (Yield Modeling)

    27 Mar 2019 | | Contributor(s):: Taylor, Hayden

    Ways to evaluate a lithography process. Topics include: resolution; line edge roughness; overlay capability; throughput; cost of ownership; capital cost; energy consumption and environmental impact (e.g. solvent usage; material wastage); pattern dependencies.

  3. MSEN 201 Lecture 8.1: Defects - Edge Dislocations

    13 Feb 2019 | | Contributor(s):: Patrick J Shamberger

  4. MSEN 201 Lecture 8.2: Defects - Screw Dislocations

    13 Feb 2019 | | Contributor(s):: Patrick J Shamberger

  5. MSEN 201 Lecture 8.3: Defects - Point Defects

    13 Feb 2019 | | Contributor(s):: Patrick J Shamberger

  6. Fundamentals of Phonon Transport Modeling L5: Phonon-Boundary and Phonon-Defect Scattering

    04 Jan 2017 | | Contributor(s):: Alan McGaughey, Xiulin Ruan

    Part of the 2016 IMECE Tutorial: Fundamentals of Phonon Transport Modeling: Formulation, Implementation, and Applications.

  7. Cu in CdTe Lab (2D Version)

    12 Jul 2016 | | Contributor(s):: Abdul Rawoof Shaik, Dragica Vasileska, Da Guo, Richard Akis

    2D diffusion-reaction simulator of Cu migration in polycrystaline CdTe solar cells with Grain Boundaries

  8. Muddiest Points: Crystal Defects and Burgers Vectors

    Collections | 01 Mar 2016 | Posted by Tanya Faltens

    http://nanohub.org/groups/materials/collections/videos--tensile-testing-dislocations-plastic-deformation

  9. Atefeh Nazari

    http://nanohub.org/members/95665

  10. ECE 695A Lecture 18: DC-IV and Charge Pumping Methods

    25 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Recall: Properties of Interface DefectsFlux-based method 1: Direct Current-Voltage methodFlux-based method 2: Charge pumping methodConclusions

  11. ECE 695A Lecture 6: Defects in the Bulk and at Interfaces

    01 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Strain in materials/origin of defectsExamples: bulk defectsExamples: interface defectsMeasurementsConclusions

  12. ECE 695A Lecture 5: Amorphous Material/Interfaces

    29 Jan 2013 | | Contributor(s):: Muhammad Alam

    Outline:Amorphous vs. crystalline materialsDefect-free amorphous materialOrigin of defects (Maxwell’s relation)Conclusions

  13. Roman Nazarov

    http://nanohub.org/members/69136

  14. Ganesh Krishna Hegde

    http://nanohub.org/members/20954