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ME 290R Lecture 2.1: Lithography Performance Criteria - Technical
27 Mar 2019 | | Contributor(s):: Taylor, Hayden
Ways to evaluate a lithography process. Topics include: resolution; line edge roughness; overlay capability; throughput; cost of ownership; capital cost; energy consumption and environmental impact (e.g. solvent usage; material wastage); pattern dependencies.
ME 290R Lecture 2.2: Lithography Performance Criteria - Technical (Yield Modeling)
MSEN 201 Lecture 8.1: Defects - Edge Dislocations
13 Feb 2019 | | Contributor(s):: Patrick J Shamberger
MSEN 201 Lecture 8.2: Defects - Screw Dislocations
MSEN 201 Lecture 8.3: Defects - Point Defects
Fundamentals of Phonon Transport Modeling L5: Phonon-Boundary and Phonon-Defect Scattering
04 Jan 2017 | | Contributor(s):: Alan McGaughey, Xiulin Ruan
Part of the 2016 IMECE Tutorial: Fundamentals of Phonon Transport Modeling: Formulation, Implementation, and Applications.
Cu in CdTe Lab (2D Version)
12 Jul 2016 | | Contributor(s):: Abdul Rawoof Shaik, Dragica Vasileska, Da Guo, Richard Akis
2D diffusion-reaction simulator of Cu migration in polycrystaline CdTe solar cells with Grain Boundaries
Muddiest Points: Crystal Defects and Burgers Vectors
01 Mar 2016 |
Posted by Tanya Faltens
ECE 695A Lecture 18: DC-IV and Charge Pumping Methods
25 Feb 2013 | | Contributor(s):: Muhammad Alam
Outline:Recall: Properties of Interface DefectsFlux-based method 1: Direct Current-Voltage methodFlux-based method 2: Charge pumping methodConclusions
ECE 695A Lecture 6: Defects in the Bulk and at Interfaces
01 Feb 2013 | | Contributor(s):: Muhammad Alam
Outline:Strain in materials/origin of defectsExamples: bulk defectsExamples: interface defectsMeasurementsConclusions
ECE 695A Lecture 5: Amorphous Material/Interfaces
29 Jan 2013 | | Contributor(s):: Muhammad Alam
Outline:Amorphous vs. crystalline materialsDefect-free amorphous materialOrigin of defects (Maxwell’s relation)Conclusions
Ganesh Krishna Hegde