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Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10480
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Device Characterization with the Keithley 4200-SCS
20 Jan 2011 | Courses | Contributor(s): Lee Stauffer
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as …
https://nanohub.org/resources/10386
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Atomistic Modeling and Simulation Tools for Nanoelectronics and their Deployment on nanoHUB.org
16 Dec 2010 | Online Presentations | Contributor(s): Gerhard Klimeck
At the nanometer scale the concepts of device and material meet and a new device is a new material and vice versa. While atomistic device representations are novel to device physicists, the …
https://nanohub.org/resources/10199
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Chemically Enhanced Carbon-Based Nanomaterials and Devices
09 Nov 2010 | Online Presentations | Contributor(s): Mark Hersam
Carbon-based nanomaterials have attracted significant attention due to their potential to enable and/or improve applications such as transistors, transparent conductors, solar cells, batteries, and …
https://nanohub.org/resources/9929
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Nanoelectronic Devices, With an Introduction to Spintronics
09 Sep 2010 | Courses | Contributor(s): Supriyo Datta, Mark Lundstrom
Nanoelectronic devices are at the heart of today's powerful computers and are also of great interest for many emerging applications including energy conversion, sensing and alternative computing …
https://nanohub.org/resources/9363
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Discussion Session 2 (Lectures 3 and 4)
08 Sep 2010 | Online Presentations | Contributor(s): Supriyo Datta
“Electronics from the Bottom Up” is an educational initiative designed to bring a new perspective to the field of nano device engineering. It is co-sponsored by the Intel Foundation and the …
https://nanohub.org/resources/9664
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Lecture 3: Thermoelectricity: Energy from heat
08 Sep 2010 | Online Presentations | Contributor(s): Supriyo Datta
“Electronics from the Bottom Up” is an educational initiative designed to bring a new perspective to the field of nano device engineering. It is co-sponsored by the Intel Foundation and the …
https://nanohub.org/resources/9659
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Nanoelectronic Modeling Lecture 40: Performance Limitations of Graphene Nanoribbon Tunneling FETS due to Line Edge Roughness
05 Aug 2010 | Online Presentations | Contributor(s): Gerhard Klimeck, Mathieu Luisier
This presentation the effects of line edge roughness on graphene nano ribbon (GNR) transitors.. Learning Objectives: GNR TFET Simulation pz Tight-Binding Orbital Model 3D …
https://nanohub.org/resources/9283
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Nanoelectronic Modeling Lecture 39: OMEN: Band-to-Band-Tunneling Transistors
05 Aug 2010 | Online Presentations | Contributor(s): Gerhard Klimeck, Mathieu Luisier
This presentation discusses the motivation for band-to-band tunneling transistors to lower the power requirements of the next generation transistors. The capabilities of OMEN to model such complex …
https://nanohub.org/resources/9282
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Lecture 1b: Nanotransistors - A Bottom Up View
20 Jul 2010 | Online Presentations | Contributor(s): Mark Lundstrom
MOSFET scaling continues to take transistors to smaller and smaller dimensions. Today, the MOSFET is a true nanoelectronic device – one of enormous importance for computing, data storage, and for …
https://nanohub.org/resources/9344
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Drift-Diffusion Modeling and Numerical Implementation Details
01 Jun 2010 | Teaching Materials | Contributor(s): Dragica Vasileska
This tutorial describes the constitutive equations for the drift-diffusion model and implementation details such as discretization and numerical solution of the algebraic equations that result from …
https://nanohub.org/resources/9092
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Lecture 7: On Reliability and Randomness in Electronic Devices
14 Apr 2010 | Online Presentations | Contributor(s): Muhammad A. Alam
Outline: Background
information Principles
of
reliability
physics Classification
of
Electronic
Reliability Structure
Defects
in
Electronic
Materials Conclusions
https://nanohub.org/resources/7175
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Lecture 9: Breakdown in Thick Dielectrics
05 Apr 2010 | Online Presentations | Contributor(s): Muhammad A. Alam
Outline: Breakdown in gas dielectric and Paschen’s law Spatial and temporal dynamics during breakdown Breakdown in bulk oxides: puzzle Theory of pre-existing defects: Thin oxides Theory of …
https://nanohub.org/resources/7177
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Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown
10 Mar 2010 | Online Presentations | Contributor(s): Muhammad A. Alam
https://nanohub.org/resources/7176
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Nanoelectronic Modeling Lecture 23: NEMO1D - Importance of New Boundary Conditions
09 Mar 2010 | Online Presentations | Contributor(s): Gerhard Klimeck
One of the key insights gained during the NEMO1D project was the development of new boundary conditions that enabled the modeling of realistically extended Resonant Tunneling Diodes (RTDs). The new …
https://nanohub.org/resources/8592
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Illinois ECE 440 Solid State Electronic Devices, Lecture 22&23: P-N Junction Capacitance; Contacts
07 Mar 2010 | Online Presentations | Contributor(s): Eric Pop
…
https://nanohub.org/resources/8615
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Illinois ECE 440 Solid State Electronic Devices, Lecture 24: Narrow-base P-N Diode
07 Mar 2010 | Online Presentations | Contributor(s): Eric Pop
…
https://nanohub.org/resources/8618
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Illinois ECE 440 Solid State Electronic Devices, Lecture 25: Intro to BJT
07 Mar 2010 | Online Presentations | Contributor(s): Eric Pop
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https://nanohub.org/resources/8621
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Illinois ECE 440 Solid State Electronic Devices, Lecture 26: Narrow-base BJT
07 Mar 2010 | Online Presentations | Contributor(s): Eric Pop
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https://nanohub.org/resources/8624
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Illinois ECE 440 Solid State Electronic Devices, Lecture 27: BJT Gain
07 Mar 2010 | Online Presentations | Contributor(s): Eric Pop
…
https://nanohub.org/resources/8627