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Device Parameters Extraction Within Silvaco Simulation Software
30 Jul 2011 | Contributor(s):: Dragica Vasileska
This set of slides explains the extract statements within SILVACO simulation software.
20 Jun 2011 | Contributor(s):: Dragica Vasileska
This set of slides describes the electron-electron interactions scattering rates calculations as it occurs in bulk materials, low-dimensional structures and semiconductor devices.
Atomistic Simulations of Reliability
06 Jul 2010 | Contributor(s):: Dragica Vasileska
Discrete impurity effects in terms of their statistical variations in number and position in the inversion and depletion region of a MOSFET, as the gate length is aggressively scaled, have recently been researched as a major cause of reliability degradation observed in intra-die and die-to-die...
Tutorial for PADRE Based Simulation Tools
10 Aug 2009 | Contributor(s):: Dragica Vasileska, Gerhard Klimeck
This tutorial is intended for first time and medium level users of PADRE-based simulation modules installed on the nanohub. It gives clear overview on the capabilities of each tool with emphasis to most important effects occuring in nano-scale devices.