Tags: device variability

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  1. Multi-walled/Single-walled Carbon Nanotube (MWCNT/SWCNT) Interconnect Lumped Compact Model Considering Defects, Contact resistance and Doping impact

    11 Jul 2018 | Compact Models | Contributor(s):

    By Rongmei Chen1, Jie LIANG1, Jaehyun Lee2, Vihar Georgiev2, Aida Todri1

    1. CNRS 2. University of Glasgow

    In this project, we present SWCNT and MWCNT interconnect compact models. These models consider the impact of CNT defects, the chirality and contact resistance between CNT-electrode (Pd) on CNT...

    http://nanohub.org/publications/243/?v=1