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ECE 695A Lecture 21: Introduction to Dielectric Breakdown
05 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Basic features of gate dielectric breakdown
Physical characterization of breakdown spot
Time-dependent defect generation
ECE 695A Lecture 21R: Review Questions
12 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
What is the name of the failure distribution that we expect for thin oxides?
For thin oxides, is PMOS or NMOS more of a concern in modern transistors?
What is DBIE? When...
ECE 695A Lecture 22: Voltage Dependence of Thin Dielectric Breakdown
ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model
21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Observations: Failure times are statistically distributed
Models of Failure Distribution: Extrinsic vs. percolation
Percolation theory of multiple Breakdown
ECE 695A Lecture 25: Theory of Soft and Hard Breakdown
Oxide breakdowns need not be catastrophic
Observations about soft vs. hard breakdown
A simple model for soft/hard breakdown
Interpretation of experiments
ECE 695A Lecture 26-1: Statistics of Soft Breakdown via Methods of Markov Chains
28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Spatial vs. Temporal correlation
Theory of correlated Dielectric Breakdown
Excess leakage as a signature of correlated BD
ECE 695A Lecture 26-2: Statistics of Soft Breakdown (Breakdown Position correlation)
Position and time correlation of BD spot
How to determine the position of the BD Spot
Position correlation in BD spots
Why is localization so weak?
ECE 695A Lecture 28: Circuit Implications of Dielectric Breakdown
08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Part 1 - Understanding Post-BD FET behavior
BD position determination
Hard and Soft BD in FETs
Distinguishing leakage and intrinsic FET parameters shifts
Part 2 - Impact of...
ECE 695A Lecture 29: Breakdown of Thick Dielectrics
Spatial and temporal dynamics during breakdown
Breakdown in bulk oxides: puzzle
ECE 695A Lecture 30: Breakdown in Dielectrics with Defects
Theory of pre-existing defects: Thin oxides
Theory of pre-existing defects: thick oxides
Introduction to Reliability
Generalized Reliability Model
A Blind Fish in a River with a Waterfall
Many reliability problems are activated by a threshold. If this threshold value is exceeded, some phenomenons are...
[Illinois] AVS Meeting 2012: Dielectric Breakdown Study for High Performance, Reliable Top-gated Large-area Graphene Electronics
04 Jun 2013 | Online Presentations | Contributor(s): Vinod K. Sangwan
An ultra-thin top-gate dielectric is essential for high-performance large-scale digital and analog electronics based on graphene field-effect transistors (G-FETs). Atomic layer deposition (ALD)...