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Tags: electron microscopy

Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

Resources (21-40 of 45)

  1. MSE 582 Lecture 12: Analytical Electron Microscopy

    15 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4023

  2. MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

    14 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4018

  3. MSE 582 Lecture 10: Diffraction Contrast Imaging

    13 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4013

  4. MSE 582 Lecture 9: Diffraction

    11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4008

  5. MSE 582 Lecture 8: Electron Scattering

    11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4003

  6. MSE 582 Lecture 7: Sample Preperation

    11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3998

  7. MSE 582 Lecture 5: Electron Detection

    04 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3921

  8. MSE 582 Lecture 6: Vacuum Science in EM

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3926

  9. MSE 582 Lecture 4: The Instrument, Part 2

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3916

  10. MSE 582 Lecture 1: Introduction

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3778

  11. MSE 582 Lecture 4: The Instrument, Part 1

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3907

  12. MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3901

  13. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

    10 May 2007 | Online Presentations | Contributor(s): Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the...

    http://nanohub.org/resources/2635

  14. Understanding Deformation Processes in Nanocrystalline Metals Through the Use of Real-time Electron Microscopy Techniques

    03 May 2007 | Online Presentations | Contributor(s): Eric Stach

    It is has long been known that the grain size of a material has a substantial effect on its mechanical strength, through the well-established Hall-Petch relationship. In the past decade or so,...

    http://nanohub.org/resources/2689

  15. What Can the TEM Tell You About Your Nanomaterial?

    26 Feb 2007 | Online Presentations | Contributor(s): Eric Stach

    In this tutorial, I will present a brief overview of the ways that transmission electron microscopy can be used to characterize nanoscale materials. This tutorial will emphasize what TEM does...

    http://nanohub.org/resources/2359

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