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Tags: electron microscopy

Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

Resources (1-20 of 45)

  1. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

    10 May 2007 | Online Presentations | Contributor(s): Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the...

    http://nanohub.org/resources/2635

  2. ECET 499N Lecture 8: Electron Microscopy

    02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach

    Guest lecture: Eric A. Stach

    http://nanohub.org/resources/8587

  3. Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

    18 Feb 2010 | Online Presentations | Contributor(s): Klaus Schulten

    http://nanohub.org/resources/8511

  4. Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)

    11 Apr 2008 | Online Presentations | Contributor(s): Paul R Selvin

    Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at heads Nanometer spatial localization, Second temporal resolution, Single Molecule sensitivity Single Molecule Photostability

    http://nanohub.org/resources/4304

  5. MSE 582 Lecture 10: Diffraction Contrast Imaging

    13 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4013

  6. MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

    14 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4018

  7. MSE 582 Lecture 12: Analytical Electron Microscopy

    15 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4023

  8. MSE 582 Lecture 1: Introduction

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3778

  9. MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3901

  10. MSE 582 Lecture 4: The Instrument, Part 1

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3907

  11. MSE 582 Lecture 4: The Instrument, Part 2

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3916

  12. MSE 582 Lecture 5: Electron Detection

    04 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3921

  13. MSE 582 Lecture 6: Vacuum Science in EM

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3926

  14. MSE 582 Lecture 7: Sample Preperation

    11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/3998

  15. MSE 582 Lecture 8: Electron Scattering

    11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4003

  16. MSE 582 Lecture 9: Diffraction

    11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4008

  17. MSE 640 Lecture 11: Diffraction contrast imaging

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Thickness fringes, Bend contours, Planar faults

    http://nanohub.org/resources/4636

  18. MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

    http://nanohub.org/resources/4637

  19. MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

    http://nanohub.org/resources/4638

  20. MSE 640 Lecture 13: Diffraction contrast imaging

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Weak beam dark field imaging, Simulation of diffraction contrast

    http://nanohub.org/resources/4639

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