Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.
Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
out of 5 stars
10 May 2007 | | Contributor(s):: Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | | Contributor(s):: Klaus Schulten
Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)
11 Apr 2008 | | Contributor(s):: Paul R Selvin
Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at headsNanometer spatial localization, Second temporal resolution, Single Molecule sensitivitySingle Molecule Photostability
MSE 582 Lecture 10: Diffraction Contrast Imaging
13 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM
14 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 12: Analytical Electron Microscopy
15 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 1: Introduction
28 Jan 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources
MSE 582 Lecture 4: The Instrument, Part 1
MSE 582 Lecture 5: Electron Detection
04 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 6: Vacuum Science in EM
MSE 582 Lecture 7: Sample Preperation
11 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 8: Electron Scattering
MSE 582 Lecture 9: Diffraction
MSE 640 Lecture 11: Diffraction contrast imaging
29 May 2008 | | Contributor(s):: Eric Stach
Thickness fringes, Bend contours, Planar faults
MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
MSE 640 Lecture 13: Diffraction contrast imaging
Weak beam dark field imaging, Simulation of diffraction contrast
MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM