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Note: Results do not include pending, unpublished, and some private items.

Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

Resources (1-20 of 44)

  1. [Illinois] AVS Meeting 2012: Photoelectron and Electron Spectro-Microscopy in Liquids and Dense Gaseous Environment Using Electron Transparent Membranes

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    04 Jun 2013 | Online Presentations | Contributor(s): Andrei Kolmakov

    Novel bottom-up designed materials currently constitute the major source of innovations in electronics, optics, energy harvesting/storage, catalysis and bio-medical applications. The performance of …

    https://nanohub.org/resources/18254

  2. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

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    26 Oct 2012 | Notes | Contributor(s): Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic …

    https://nanohub.org/resources/15606

  3. Nanoscale Dimensions in Hard Disk Media

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    27 Sep 2012 | Notes | Contributor(s): Brian Demczyk

    This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant …

    https://nanohub.org/resources/15322

  4. Nanostructure of Perpendicular Recording Media

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    26 Sep 2012 | Publications | Contributor(s): Brian Demczyk

    This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.

    https://nanohub.org/resources/15304

  5. Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films

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    02 Feb 2012 | Publications | Contributor(s): Brian Demczyk

    In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations …

    https://nanohub.org/resources/13031

  6. Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns

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    30 Jan 2012 | Publications | Contributor(s): Brian Demczyk

    This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.

    https://nanohub.org/resources/12967

  7. ECET 499N Lecture 8: Electron Microscopy

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    02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach

    Guest lecture: Eric A. Stach

    https://nanohub.org/resources/8587

  8. Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

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    18 Feb 2010 | Online Presentations | Contributor(s): Klaus Schulten

    …

    https://nanohub.org/resources/8511

  9. ECET 499N: Introduction to Nanotechnology

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    30 Mar 2009 | Courses | Contributor(s): Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical …

    https://nanohub.org/resources/6583

  10. MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1

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    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4641

  11. MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM

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    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4640

  12. MSE 640 Lecture 13: Diffraction contrast imaging

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    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Weak beam dark field imaging, Simulation of diffraction contrast

    https://nanohub.org/resources/4639

  13. MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

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    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

    https://nanohub.org/resources/4637

  14. MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

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    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

    https://nanohub.org/resources/4638

  15. MSE 640 Lecture 11: Diffraction contrast imaging

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    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Thickness fringes, Bend contours, Planar faults

    https://nanohub.org/resources/4636

  16. MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)

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    28 May 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4660

  17. MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM

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    28 May 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4655

  18. MSE 640 Lecture 18: X-ray production in the TEM

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    28 May 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4649

  19. MSE 640 Lecture 17: STEM Imaging

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    27 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Much of the material for this class is courtesy of Nigel Browning of UC Davis & LLNL and Dave Muller of Cornell.

    https://nanohub.org/resources/4644

  20. MSE 640 Lecture 5,6,7: Review

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    17 Apr 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4363

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