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An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.
Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.
Non-Rigid Registration for STEM
24 Sep 2015 |
This tool provides non-rigid registration and averaging of a series of scanning transmission electron microscopy images.
09 Jun 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Benjamin P Haley, Volkan Ortalan
Online IMOD tool for electron tomography
[Illinois] AVS Meeting 2012: Photoelectron and Electron Spectro-Microscopy in Liquids and Dense Gaseous Environment Using Electron Transparent Membranes
03 Jun 2013 | | Contributor(s):: Andrei Kolmakov
Novel bottom-up designed materials currently constitute the major source of innovations in electronics, optics, energy harvesting/storage, catalysis and bio-medical applications. The performance of these new materials and devices depends on physicochemical processes taking place at the interface...
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
25 Oct 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...
Nanoscale Dimensions in Hard Disk Media
27 Sep 2012 | | Contributor(s):: Brian Demczyk
This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.
Nanostructure of Perpendicular Recording Media
21 Sep 2012 | | Contributor(s):: Brian Demczyk
This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.
Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | | Contributor(s):: Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.
Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns
27 Jan 2012 | | Contributor(s):: Brian Demczyk, D. E. Laughlin
This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
17 Feb 2010 | | Contributor(s):: Klaus Schulten
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
out of 5 stars
29 May 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
MSE 640 Lecture 13: Diffraction contrast imaging
Weak beam dark field imaging, Simulation of diffraction contrast
MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
MSE 640 Lecture 11: Diffraction contrast imaging
Thickness fringes, Bend contours, Planar faults
MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)
28 May 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM
MSE 640 Lecture 18: X-ray production in the TEM