Support

Support Options

Submit a Support Ticket

 
Home › Tags › electron microscopy › Resources

Tags: electron microscopy

Categories

Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

Resources (21-40 of 43)

  1. Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)

    This resource has a 8.2 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 953
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    11 Apr 2008 | Online Presentations | Contributor(s): Paul R Selvin

    Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at heads Nanometer spatial localization, Second temporal resolution, Single Molecule sensitivity Single Molecule Photostability

    https://nanohub.org/resources/4304

  2. MSE 640 Lecture 5: Diffraction from Crystals "Structure Factor", Part 2

    This resource has a 8.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1056
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    18 Mar 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4155

  3. MSE 640 Lecture 4: Laue Diffraction and the Reciprocal Lattice

    This resource has a 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 6954
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    05 Mar 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4109

  4. MSE 640 Lecture 2: Elastic Scattering, Part 2

    This resource has a 7.6 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 903
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    03 Mar 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4099

  5. MSE 640 Transmission Electron Microscopy and Crystalline Imperfections

    This resource has a 7.1 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 13662
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    25 Feb 2008 | Courses | Contributor(s): Eric Stach

    https://nanohub.org/resources/4092

  6. MSE 640 Lecture 2: Elastic Scattering, Part 1

    This resource has a 9.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1951
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    25 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4094

  7. MSE 582 Lecture 12: Analytical Electron Microscopy

    This resource has a 8.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1825
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    15 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4023

  8. MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

    This resource has a 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 4270
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    14 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4018

  9. MSE 582 Lecture 10: Diffraction Contrast Imaging

    This resource has a 7.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1943
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    13 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4013

  10. MSE 582 Lecture 9: Diffraction

    This resource has a 7.8 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1707
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4008

  11. MSE 582 Lecture 8: Electron Scattering

    This resource has a 7.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1339
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/4003

  12. MSE 582 Lecture 7: Sample Preperation

    This resource has a 7.6 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1399
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/3998

  13. MSE 582 Lecture 5: Electron Detection

    This resource has a 9.1 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1225
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    04 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/3921

  14. MSE 582 Lecture 6: Vacuum Science in EM

    This resource has a 9.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1285
    Reviews & Citations
    Google/IEEE
    Avg. Review: 5.0 out of 5 stars
    Citations:

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/3926

  15. MSE 582 Lecture 4: The Instrument, Part 2

    This resource has a 9.8 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 1590
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/3916

  16. MSE 582 Lecture 1: Introduction

    This resource has a 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 2501
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/3778

  17. MSE 582 Lecture 4: The Instrument, Part 1

    This resource has a 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 2021
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/3907

  18. MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources

    This resource has a 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 3823
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

    https://nanohub.org/resources/3901

  19. MSE 582 Transmission Electron Microscopy Skills

    This resource has a 8.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 11927
    Reviews & Citations
    Google/IEEE
    Avg. Review: 5.0 out of 5 stars
    Citations:

    28 Jan 2008 | Courses | Contributor(s): Eric Stach

    Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all …

    https://nanohub.org/resources/3777

  20. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

    This resource has a 6.2 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 03 May 2013
    Users: 488
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    10 May 2007 | Online Presentations | Contributor(s): Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming …

    https://nanohub.org/resources/2635

Get Help

Get Involved

Legal

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies.