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An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.
Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.
Non-Rigid Registration for STEM
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02 Dec 2015 | Tools
This tool provides non-rigid registration and averaging of a series of scanning transmission electron microscopy images.
29 Aug 2014 | Tools | Contributor(s): Mingxuan Lu, Chang Wan Han, Benjamin P Haley, Volkan Ortalan
Online IMOD tool for electron tomography
[Illinois] AVS Meeting 2012: Photoelectron and Electron Spectro-Microscopy in Liquids and Dense Gaseous Environment Using Electron Transparent Membranes
04 Jun 2013 | Online Presentations | Contributor(s): Andrei Kolmakov
Novel bottom-up designed materials currently constitute the major source of innovations in electronics, optics, energy harvesting/storage, catalysis and bio-medical applications. The performance...
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining...
Nanoscale Dimensions in Hard Disk Media
27 Sep 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant...
Nanostructure of Perpendicular Recording Media
26 Sep 2012 | Papers | Contributor(s): Brian Demczyk
This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.
Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | Papers | Contributor(s): Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations...
Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns
30 Jan 2012 | Papers | Contributor(s): Brian Demczyk, D. E. Laughlin
This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach
Guest lecture: Eric A. Stach
Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | Online Presentations | Contributor(s): Klaus Schulten
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | Courses | Contributor(s): Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical...
MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
29 May 2008 | Online Presentations | Contributor(s): Eric Stach
MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
MSE 640 Lecture 13: Diffraction contrast imaging
Weak beam dark field imaging, Simulation of diffraction contrast
MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
MSE 640 Lecture 11: Diffraction contrast imaging
Thickness fringes, Bend contours, Planar faults
MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)
28 May 2008 | Online Presentations | Contributor(s): Eric Stach
MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM
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MSE 640 Lecture 18: X-ray production in the TEM