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BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | | Contributor(s):: Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
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Characterization - Scanning Electron Microscopy
11 Jan 2022 | | Contributor(s):: Atilla Ozgur Cakmak, NACK Network
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ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
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ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
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Electron Microscopy
24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlineScanning Electron MicroscopyField Emission Scanning Electron MicroscopyTransmission Electron MicroscopyEnergy Dispersive Spectroscopy
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Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | | Contributor(s):: Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.
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Fundamentals of Metrology and Characterization for Nanotechnology
13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network
Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it
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Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | | Contributor(s):: Klaus Schulten
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IMOD online
09 Jun 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Benjamin P Haley, Volkan Ortalan
Online IMOD tool for electron tomography
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Introduction to Field Emission Scanning Electron Microscopy (FESEM)
10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
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Introduction to Scanning Electron Microscopy (SEM)
10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
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Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)
11 Apr 2008 | | Contributor(s):: Paul R Selvin
Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at heads Nanometer spatial localization, Second temporal resolution, Single Molecule sensitivity Single Molecule Photostability
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Lecture 8: Resolutions
07 Apr 2008 | | Contributor(s):: Paul R Selvin
X-ray diffraction (atomic resolution)Electron (Imaging) Microscopy (nm-scale)Visible (Imaging) Microscopy (nm - µm)
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Lecture 9: X-ray Structure and FIONA
07 Apr 2008 | | Contributor(s):: Paul R Selvin
Accuracy vs. Resolution Measuring atomic distances Biomolecular Motors: Intra- AND Extra-Cellular Motion
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Like Driving a Car: Acquiring Quality SEM/FESEM Images in Different Situations
19 Oct 2022 | | Contributor(s):: Bangzhi Liu, NACK Network
Getting good SEM/FESEM images is dependent on both the sample conditions (conductivity, bulk vs. thin film, etc) and the instrument’s imaging parameters (e.g., beam voltage, beam current, working distance, detector, etc). This webinar will simplify and explain the complex nature...
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Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns
27 Jan 2012 | | Contributor(s):: Brian Demczyk, D. E. Laughlin
This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.
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MSE 582 Lecture 10: Diffraction Contrast Imaging
13 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM
14 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 12: Analytical Electron Microscopy
15 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 1: Introduction
28 Jan 2008 | | Contributor(s):: Eric Stach