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An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.
Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
out of 5 stars
10 May 2007 | | Contributor(s):: Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | | Contributor(s):: Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.
Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | | Contributor(s):: Klaus Schulten
09 Jun 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Benjamin P Haley, Volkan Ortalan
Online IMOD tool for electron tomography
Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)
11 Apr 2008 | | Contributor(s):: Paul R Selvin
Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at headsNanometer spatial localization, Second temporal resolution, Single Molecule sensitivitySingle Molecule Photostability
Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns
27 Jan 2012 | | Contributor(s):: Brian Demczyk, D. E. Laughlin
This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.
MSE 582 Lecture 10: Diffraction Contrast Imaging
13 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM
14 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 12: Analytical Electron Microscopy
15 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 1: Introduction
28 Jan 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources
MSE 582 Lecture 4: The Instrument, Part 1
MSE 582 Lecture 5: Electron Detection
04 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 6: Vacuum Science in EM
MSE 582 Lecture 7: Sample Preperation
11 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 8: Electron Scattering
MSE 582 Lecture 9: Diffraction
MSE 582 Transmission Electron Microscopy Skills
Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.