Tags: electron microscopy

Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

Resources (21-40 of 44)

  1. MSE 640 Lecture 11: Diffraction contrast imaging

    29 May 2008 | | Contributor(s):: Eric Stach

    Thickness fringes, Bend contours, Planar faults

  2. MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  3. MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  4. MSE 640 Lecture 13: Diffraction contrast imaging

    29 May 2008 | | Contributor(s):: Eric Stach

    Weak beam dark field imaging, Simulation of diffraction contrast

  5. MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM

    29 May 2008 | | Contributor(s):: Eric Stach

  6. MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1

    29 May 2008 | | Contributor(s):: Eric Stach

  7. MSE 640 Lecture 17: STEM Imaging

    27 May 2008 | | Contributor(s):: Eric Stach

  8. MSE 640 Lecture 18: X-ray production in the TEM

    28 May 2008 | | Contributor(s):: Eric Stach

  9. MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM

    28 May 2008 | | Contributor(s):: Eric Stach

  10. MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)

    28 May 2008 | | Contributor(s):: Eric Stach

  11. MSE 640 Lecture 2: Elastic Scattering, Part 1

    25 Feb 2008 | | Contributor(s):: Eric Stach

  12. MSE 640 Lecture 2: Elastic Scattering, Part 2

    03 Mar 2008 | | Contributor(s):: Eric Stach

  13. MSE 640 Lecture 4: Laue Diffraction and the Reciprocal Lattice

    05 Mar 2008 | | Contributor(s):: Eric Stach

  14. MSE 640 Lecture 5,6,7: Review

    17 Apr 2008 | | Contributor(s):: Eric Stach

  15. MSE 640 Lecture 7: Dynamical effects in diffraction patterns

    17 Apr 2008 | | Contributor(s):: Eric Stach

  16. MSE 640 Transmission Electron Microscopy and Crystalline Imperfections

    25 Feb 2008 | | Contributor(s):: Eric Stach

  17. Nanoscale Dimensions in Hard Disk Media

    27 Sep 2012 | | Contributor(s):: Brian Demczyk

    This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.

  18. Nanostructure of Perpendicular Recording Media

    26 Sep 2012 | | Contributor(s):: Brian Demczyk

    This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.

  19. Non-Rigid Registration for STEM

    24 Sep 2015 |

    This tool provides non-rigid registration and averaging of a series of scanning transmission electron microscopy images.

  20. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

    25 Oct 2012 | | Contributor(s):: Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...