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BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | | Contributor(s):: Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
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Brian Demczyk
My research experience has included the areas of energy storage (batteries and fuel cells), nanophase materials (catalysts, nanotubes and quantum dots), the development of stresses in thin films...
http://nanohub.org/members/56446
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David Charles Martin
1983 B. S. in Materials and Metallurgical Engineering, The University of Michigan1985 M. S. in Macromolecular Science and Engineering, The University of Michigan1990 Ph.D. in Polymer Science and...
http://nanohub.org/members/45318
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ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
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ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
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Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | | Contributor(s):: Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.
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Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | | Contributor(s):: Klaus Schulten
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IMOD online
09 Jun 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Benjamin P Haley, Volkan Ortalan
Online IMOD tool for electron tomography
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Kevin Grossklaus
I am a graduate research assistant at the University of Michigan- Ann Arbor, working in the Millunchick group. My research exams ion irradiation effects on III-V semiconductor film growth, ion...
http://nanohub.org/members/60848
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Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)
11 Apr 2008 | | Contributor(s):: Paul R Selvin
Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at headsNanometer spatial localization, Second temporal resolution, Single Molecule sensitivitySingle Molecule Photostability
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Matt Schneider
http://nanohub.org/members/66808
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Matthew Glen Robertson
http://nanohub.org/members/149764
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Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns
27 Jan 2012 | | Contributor(s):: Brian Demczyk, D. E. Laughlin
This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.
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MSE 582 Lecture 10: Diffraction Contrast Imaging
13 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM
14 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 12: Analytical Electron Microscopy
15 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 1: Introduction
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 4: The Instrument, Part 1
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 5: Electron Detection
04 Feb 2008 | | Contributor(s):: Eric Stach