Tags: electron microscopy

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Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

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  1. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

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    10 May 2007 | | Contributor(s):: Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.

  2. Brian Demczyk

    My research experience has included the areas of energy storage (batteries and fuel cells), nanophase materials (catalysts, nanotubes and quantum dots), the development of stresses in thin films...

    http://nanohub.org/members/56446

  3. David Charles Martin

    1983 B. S. in Materials and Metallurgical Engineering, The University of Michigan1985 M. S. in Macromolecular Science and Engineering, The University of Michigan1990 Ph.D. in Polymer Science and...

    http://nanohub.org/members/45318

  4. ECET 499N Lecture 8: Electron Microscopy

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    02 Mar 2010 | | Contributor(s):: Eric Stach

    Guest lecture: Eric A. Stach

  5. ECET 499N: Introduction to Nanotechnology

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    30 Mar 2009 | | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  6. Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films

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    02 Feb 2012 | | Contributor(s):: Brian Demczyk

    In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.

  7. Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

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    18 Feb 2010 | | Contributor(s):: Klaus Schulten

  8. IMOD online

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    09 Jun 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Benjamin P Haley, Volkan Ortalan

    Online IMOD tool for electron tomography

  9. Kevin Grossklaus

    I am a graduate research assistant at the University of Michigan- Ann Arbor, working in the Millunchick group. My research exams ion irradiation effects on III-V semiconductor film growth, ion...

    http://nanohub.org/members/60848

  10. Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)

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    11 Apr 2008 | | Contributor(s):: Paul R Selvin

    Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at headsNanometer spatial localization, Second temporal resolution, Single Molecule sensitivitySingle Molecule Photostability

  11. Matt Schneider

    http://nanohub.org/members/66808

  12. Matthew Glen Robertson

    http://nanohub.org/members/149764

  13. Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns

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    27 Jan 2012 | | Contributor(s):: Brian Demczyk, D. E. Laughlin

    This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.

  14. MSE 582 Lecture 10: Diffraction Contrast Imaging

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    13 Feb 2008 | | Contributor(s):: Eric Stach

  15. MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

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    14 Feb 2008 | | Contributor(s):: Eric Stach

  16. MSE 582 Lecture 12: Analytical Electron Microscopy

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    15 Feb 2008 | | Contributor(s):: Eric Stach

  17. MSE 582 Lecture 1: Introduction

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    28 Jan 2008 | | Contributor(s):: Eric Stach

  18. MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources

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    28 Jan 2008 | | Contributor(s):: Eric Stach

  19. MSE 582 Lecture 4: The Instrument, Part 1

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    28 Jan 2008 | | Contributor(s):: Eric Stach

  20. MSE 582 Lecture 5: Electron Detection

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    04 Feb 2008 | | Contributor(s):: Eric Stach