BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

10 May 2007 | Online Presentations | Contributor(s): Ron Reifenberger

This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming …

https://nanohub.org/resources/2635

ECET 499N Lecture 8: Electron Microscopy

02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach

Guest lecture: Eric A. Stach

https://nanohub.org/resources/8587

ECET 499N: Introduction to Nanotechnology

30 Mar 2009 | Courses | Contributor(s): Helen McNally

An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical …

https://nanohub.org/resources/6583

Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films

02 Feb 2012 | Publications | Contributor(s): Brian Demczyk

In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations …

https://nanohub.org/resources/13031

Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

18 Feb 2010 | Online Presentations | Contributor(s): Klaus Schulten

…

https://nanohub.org/resources/8511

Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)

11 Apr 2008 | Online Presentations | Contributor(s): Paul R Selvin

Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at heads Nanometer spatial localization, Second temporal resolution, Single Molecule sensitivity Single Molecule Photostability

https://nanohub.org/resources/4304

Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns

27 Jan 2012 | Publications | Contributor(s): Brian Demczyk

This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.

https://nanohub.org/resources/12967

MSE 582 Lecture 10: Diffraction Contrast Imaging

13 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

https://nanohub.org/resources/4013

MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

14 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

https://nanohub.org/resources/4018

MSE 582 Lecture 12: Analytical Electron Microscopy

15 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

https://nanohub.org/resources/4023

MSE 582 Lecture 1: Introduction

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

https://nanohub.org/resources/3778

MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

https://nanohub.org/resources/3901

MSE 582 Lecture 4: The Instrument, Part 1

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

https://nanohub.org/resources/3907

MSE 582 Lecture 4: The Instrument, Part 2

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

https://nanohub.org/resources/3916

MSE 582 Lecture 5: Electron Detection

04 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

https://nanohub.org/resources/3921

MSE 582 Lecture 6: Vacuum Science in EM

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

https://nanohub.org/resources/3926