Tags: electron microscopy

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Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

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  1. MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

  2. MSE 640 Lecture 17: STEM Imaging

    out of 5 stars 

    27 May 2008 | | Contributor(s):: Eric Stach

  3. MSE 640 Lecture 18: X-ray production in the TEM

    out of 5 stars 

    28 May 2008 | | Contributor(s):: Eric Stach

  4. MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM

    out of 5 stars 

    28 May 2008 | | Contributor(s):: Eric Stach

  5. MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)

    out of 5 stars 

    28 May 2008 | | Contributor(s):: Eric Stach

  6. MSE 640 Lecture 2: Elastic Scattering, Part 1

    out of 5 stars 

    25 Feb 2008 | | Contributor(s):: Eric Stach

  7. MSE 640 Lecture 2: Elastic Scattering, Part 2

    out of 5 stars 

    03 Mar 2008 | | Contributor(s):: Eric Stach

  8. MSE 640 Lecture 4: Laue Diffraction and the Reciprocal Lattice

    out of 5 stars 

    05 Mar 2008 | | Contributor(s):: Eric Stach

  9. MSE 640 Lecture 5,6,7: Review

    out of 5 stars 

    17 Apr 2008 | | Contributor(s):: Eric Stach

  10. MSE 640 Lecture 7: Dynamical effects in diffraction patterns

    out of 5 stars 

    17 Apr 2008 | | Contributor(s):: Eric Stach

  11. MSE 640 Transmission Electron Microscopy and Crystalline Imperfections

    out of 5 stars 

    25 Feb 2008 | | Contributor(s):: Eric Stach

  12. NACK Unit 6: Basic Characterization Techniques

    out of 5 stars 

    19 Jul 2018 | | Contributor(s):: NACK Network

    This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance.

  13. Nanoscale Dimensions in Hard Disk Media

    out of 5 stars 

    27 Sep 2012 | | Contributor(s):: Brian Demczyk

    This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.

  14. Nanostructure of Perpendicular Recording Media

    out of 5 stars 

    26 Sep 2012 | | Contributor(s):: Brian Demczyk

    This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.

  15. Non-Rigid Registration for STEM

    out of 5 stars 

    24 Sep 2015 |

    This tool provides non-rigid registration and averaging of a series of scanning transmission electron microscopy images.

  16. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

    out of 5 stars 

    25 Oct 2012 | | Contributor(s):: Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...

  17. RAIN Network: Scanning Electron Microscope

    out of 5 stars 

    19 Sep 2022 | | Contributor(s):: Paul D. Asimow, The Micro Nano Technology - Education Center

  18. Sheng Ying Yue

    https://nanohub.org/members/120281

  19. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

    out of 5 stars 

    19 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves

  20. Timothy Gutu

    https://nanohub.org/members/58494