Experiments and Models Regarding Strain Dependent Thermal Conductivity and Strength at the Nanoscale and Microscale

22 Sep 2011 | Online Presentations | Contributor(s): Vikas Tomar

Silicon micro- and nano-structures are essential in today’s integrated circuits and sensors. The functioning and performance of such devices are highly affected by thermal properties. Due to the …

http://nanohub.org/resources/11603

Quantum Computing - Experiments

15 Aug 2011 | Teaching Materials | Contributor(s): Dragica Vasileska, Gerhard Klimeck

http://nanohub.org/resources/11833

Quantum Coherent Effects in Photosynthesis

06 Aug 2011 | Online Presentations | Contributor(s): K. Birgitta Whaley

I shall present and discuss theoretical studies of the quantum dynamics of a prototypical photosynthetic light harvesting complex, the Fenna-Matthews-Olson (FMO) complex, that analyze the nature and …

http://nanohub.org/resources/11432

Chemistry of Transition Metal Alloy Nanoparticles with Desired Phase Properties

20 Jun 2011 | Online Presentations | Contributor(s): Lichang Wang

In this presentation, I will discuss the results of two alloy nanoparticles, PtAu and PtVFe. I will also present the synergetic results of unraveling PtVFe nanoparticles by coupling computational …

http://nanohub.org/resources/11434

ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details

14 Feb 2011 | Online Presentations | Contributor(s): Ron Reifenberger

http://nanohub.org/resources/10062

Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

24 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

http://nanohub.org/resources/10521

Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

Introduction to Device Characterization - System Overview: System Architecture, Hardware Features and Software Features - Precision DC I-V Source-Measure Features and Concepts.

http://nanohub.org/resources/10387

Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

http://nanohub.org/resources/10388

Keithley 4200-SCS Lecture 03: More KITE Setup and Features

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

http://nanohub.org/resources/10389

Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

http://nanohub.org/resources/10390

Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

http://nanohub.org/resources/10391

Keithley 4200-SCS Lecture 06: Troubleshooting

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

http://nanohub.org/resources/10392

Keithley 4200-SCS Lecture 07: KCON Utility Overview

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

http://nanohub.org/resources/10430

Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

Theory of Operation and Measurement Overview

http://nanohub.org/resources/10431

Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

Measurement Techniques and Optimization

http://nanohub.org/resources/10432

Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

Measurement Techniques and Optimization

http://nanohub.org/resources/10433

Keithley 4200-SCS: KITE Demo

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

http://nanohub.org/resources/10429

Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

http://nanohub.org/resources/10480

Device Characterization with the Keithley 4200-SCS

20 Jan 2011 | Courses | Contributor(s): Lee Stauffer

This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as …

http://nanohub.org/resources/10386

Uncertainty Quantification in Experiments

16 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman

An overview is provided of how experimental data should be reported with true uncertainties. Examples from experiments on gas damping measurements in RF switches and for estimation of nanoparticles …

http://nanohub.org/resources/10035