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Keithley 4200-SCS Lecture 07: KCON Utility Overview
20 Jan 2011 | | Contributor(s):: Lee Stauffer
Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview
Theory of Operation and Measurement Overview
Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I
Measurement Techniques and Optimization
Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II
Keithley 4200-SCS: KITE Demo
Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting
Device Characterization with the Keithley 4200-SCS
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.
ME 597A Lecture 7: Uncertainty Quantification in Experiments
16 Dec 2010 | | Contributor(s):: Arvind Raman
Guest Lecture Arvind Raman.
ME 597 Lecture 12: Experimental Uncertainties in Extracting Material Properties from F-Z Curves
29 Oct 2010 | | Contributor(s):: Ryan Wagner, Arvind Raman
Guest lecturer: Ryan Wagner.
Fun in the Sand: Some Experiments in Granular Physics
25 Oct 2010 | | Contributor(s):: Peter E. Schiffer
In the last two decades, condensed matter physicists have begun an intense study of the dynamic and static properties of granular media (materials made from individual acroscopic solid grains). These materials offer a vast arena of new physical phenomena which are highly accessible and largely...
TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties
20 Oct 2010 | | Contributor(s):: Pedro Antonio Prieto
Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) , has been achieved using compositional gradient WC/C layer, or multilayered type [transition metal/transition carbide]n, [transition metal/transition nitride]n, [TiCN/ZrCN]n, among others....
ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning
20 Oct 2010 | | Contributor(s):: Arvind Raman
The raw recording for this lecture is all that is available.
ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)
01 Sep 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman
Fall 2010A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.
Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
16 Feb 2010 | | Contributor(s):: Dmitry Zemlyanov
In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...
Lecture 4: Graphene: An Experimentalist's Perspective
12 Feb 2010 | | Contributor(s):: Joerg Appenzeller
ME 597 Lecture 22: Frequency Modulated AFM - Experimental Details
02 Feb 2010 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 20: Imaging Artifacts in AM-AFM
27 Jan 2010 | | Contributor(s):: Ron Reifenberger
Topics:Probe Tip ArtifactsInstrumental ArtifactsLarge Force ArtifactsImage Processing ArtifactsIntrinsic LimitationsTip Cleaning
ME 597 Lecture 17: Imaging or Peak Forces in Tapping Mode AFM
01 Nov 2009 | | Contributor(s):: Arvind Raman
Low Bias Transport in Graphene: An Introduction (lecture notes)
22 Sep 2009 | | Contributor(s):: Mark Lundstrom, tony low, Dionisis Berdebes
These notes complement a lecture with the same title presented by Mark Lundstrom and Dionisis Berdebes, at the NCN@Purdue Summer School, July 20-24, 2009.
Colloquium on Graphene Physics and Devices
22 Sep 2009 | | Contributor(s):: Joerg Appenzeller, Supriyo Datta, Mark Lundstrom
This short course introduces students to graphene as a fascinating research topic as well as to develop their skill in problem solving using the tools and techniques of electronics from the bottom up.