nanoHUB.org - Tags: experiments

This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.

ME 597A Lecture 7: Uncertainty Quantification in Experiments

16 Dec 2010 | | Contributor(s):: Arvind Raman

Guest Lecture Arvind Raman.

ME 597 Lecture 12: Experimental Uncertainties in Extracting Material Properties from F-Z Curves

29 Oct 2010 | | Contributor(s):: Ryan Wagner, Arvind Raman

Guest lecturer: Ryan Wagner.

Fun in the Sand: Some Experiments in Granular Physics

25 Oct 2010 | | Contributor(s):: Peter E. Schiffer

In the last two decades, condensed matter physicists have begun an intense study of the dynamic and static properties of granular media (materials made from individual acroscopic solid grains). These materials offer a vast arena of new physical phenomena which are highly accessible and largely...

TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties

20 Oct 2010 | | Contributor(s):: Pedro Antonio Prieto

Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type [transition metal/transition carbide]n, [transition metal/transition nitride]n, [TiCN/ZrCN]n, among others....

ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

20 Oct 2010 | | Contributor(s):: Arvind Raman

The raw recording for this lecture is all that is available.

ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

01 Sep 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman

Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG

16 Feb 2010 | | Contributor(s):: Dmitry Zemlyanov

In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...

Lecture 4: Graphene: An Experimentalist's Perspective

12 Feb 2010 | | Contributor(s):: Joerg Appenzeller

ME 597 Lecture 22: Frequency Modulated AFM - Experimental Details

02 Feb 2010 | | Contributor(s):: Ron Reifenberger

ME 597 Lecture 20: Imaging Artifacts in AM-AFM

27 Jan 2010 | | Contributor(s):: Ron Reifenberger

Topics:Probe Tip ArtifactsInstrumental ArtifactsLarge Force ArtifactsImage Processing ArtifactsIntrinsic LimitationsTip Cleaning

ME 597 Lecture 17: Imaging or Peak Forces in Tapping Mode AFM

01 Nov 2009 | | Contributor(s):: Arvind Raman

Low Bias Transport in Graphene: An Introduction (lecture notes)

22 Sep 2009 | | Contributor(s):: Mark Lundstrom, tony low, Dionisis Berdebes

These notes complement a lecture with the same title presented by Mark Lundstrom and Dionisis Berdebes, at the NCN@Purdue Summer School, July 20-24, 2009.

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