Tags: Frequency Modulation AFM

Resources (1-9 of 9)

  1. ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM

    29 Dec 2010 | Teaching Materials | Contributor(s): Ron Reifenberger

    Problems: Setting the feedback parameters in AM-AFM scanning Factors Affecting Contrast in dAFM Topographic and Phase Images FM-AFM A dAFM “pocket guide”

    http://nanohub.org/resources/10241

  2. ME 597 Lecture 21: Frequency Modulated AFM

    22 Nov 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/10061

  3. ME 597 Lecture 21: Frequency Modulated AFM

    02 Feb 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/7986

  4. ME 597 Lecture 22: Frequency Modulated AFM - Experimental Details

    02 Feb 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/7987

  5. ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details

    14 Feb 2011 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/10062

  6. ME 597 Lecture 23: FM-AFM Selected Results

    08 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Topics: FM-AFM Selected Results/li> Achieving Atomic Resolution with AFM

    http://nanohub.org/resources/7977

  7. ME 597 Lecture 23: FM-AFM Selected Results and Achieving Atomic Resolution with AFM

    07 Dec 2010 | Online Presentations | Contributor(s): Ron Reifenberger

    http://nanohub.org/resources/10063

  8. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

    03 Sep 2009 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman

    A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

    http://nanohub.org/resources/7320

  9. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

    01 Sep 2010 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman

    Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

    http://nanohub.org/resources/9598