Theory and characterization of random defect formation and its implication in variability of nanoscale transistors

30 Sep 2011 | Publications | Contributor(s): Ahmad Ehteshamul Islam

Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of the …

https://nanohub.org/resources/12182

A methodology for SPICE-compatible modeling of nanoMOSFETs

17 Nov 2010 | Teaching Materials | Contributor(s): Alba Graciela Avila, David Espejo

An original SPICE-compatible model for Intel's 45nm High-K MOSFET is presented. It takes into account some Quantum-Mechanical Effects that occur at small scale like Channel Length Modulation (CLM), …

https://nanohub.org/resources/10024