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Tags: high resolution electron microscopy

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  1. Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

    25 Mar 2014 | Presentation Materials | Contributor(s): Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik

    The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing...

    http://nanohub.org/resources/20737

  2. Surface structure and composition of high-surface-area molybdenum nitrides

    02 Feb 2012 | Papers | Contributor(s): Brian Demczyk, j. G. Choi, L. T. Thompson

    In this work, we have employed high-resolution transmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy to determine the near-surface structures and...

    http://nanohub.org/resources/13001

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