Due to local system maintenance on Tuesday, September 27th, nanoHUB will be unable to launch simulation jobs on clusters conte, rice, carter, and hansen. We apologize for any inconvenience.
Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
Introduction to Reliability
Generalized Reliability Model
A Blind Fish in a River with a Waterfall
Many reliability problems are activated by a threshold. If this threshold value is exceeded, some phenomenons are...
0.0 out of 5 stars
01 May 2008 | Tools | Contributor(s): SungGeun Kim, Gerhard Klimeck, Sriraman Damodaran, Benjamin P Haley
Simulate the nanoscale multigate-FET structures (finFET and nanowire) using drift diffusion approaches