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  1. Introduction to Reliability

    Generalized Reliability Model A Blind Fish in a River with a Waterfall Many reliability problems are activated by a threshold. If this threshold value is exceeded, some phenomenons are...

  2. Esteve Amat

  3. MuGFET

    17 Jan 2008 | Tools | Contributor(s): SungGeun Kim, Gerhard Klimeck, Sriraman Damodaran, Benjamin P Haley

    Simulate the nanoscale multigate-FET structures (finFET and nanowire) using drift diffusion approaches, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.