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Tags: III-V Semiconductors

Resources (1-5 of 5)

  1. Simulation and Admittance Analysis for Advanced Metal-Insulator-Semiconductor Characterization

    23 Feb 2014 | Tools | Contributor(s): Alex Grede

    Non-parabolic DOS simulation of III-V MISCAPs with impurity ionization effects and ability to view components of channel capacitance.

    http://nanohub.org/resources/samis

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