Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
Simulation and Admittance Analysis for Advanced Metal-Insulator-Semiconductor Characterization
0.0 out of 5 stars
27 Feb 2014 | Tools | Contributor(s): Alex Grede
Non-parabolic DOS simulation of III-V MISCAPs with impurity ionization effects and ability to view components of channel capacitance.