Tags: III-V Semiconductors

Tools (1-1 of 1)

  1. Simulation and Admittance Analysis for Advanced Metal-Insulator-Semiconductor Characterization

    27 Feb 2014 | Tools | Contributor(s): Alex Grede

    Non-parabolic DOS simulation of III-V MISCAPs with impurity ionization effects and ability to view components of channel capacitance.

    http://nanohub.org/resources/samis