Growth of Cu films on hydrogen terminated Si(lQ0) and Si(lll) surf&es

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

We have employed reflection high energy electron diffraction (RHEED) and high resolution transmission electron microscopy (HREM) to study Cu films grown on hydrogen terminated Si( 100) and Si( 111) …

https://nanohub.org/resources/12235

Confined Carriers - Interface Roughness Scattering

30 Jun 2011 | Teaching Materials | Contributor(s): Dragica Vasileska

This set of handwritten notes is part of the Semiconductor Transport class.

https://nanohub.org/resources/11534

Scattering rates of confined carriers

20 Jun 2011 | Teaching Materials | Contributor(s): Dragica Vasileska

Scattering rates of acoustic phonon scattering and interface roughness are described for a case of 1D confinement.

https://nanohub.org/resources/11413