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Growth of Cu films on hydrogen terminated Si(lQ0) and Si(lll) surf&es
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07 Oct 2011 | Publications | Contributor(s): Brian Demczyk
We have employed reflection high energy electron diffraction (RHEED) and high resolution transmission electron microscopy (HREM) to study Cu films grown on hydrogen terminated Si( 100) and Si( 111) …
Confined Carriers - Interface Roughness Scattering
30 Jun 2011 | Teaching Materials | Contributor(s): Dragica Vasileska
This set of handwritten notes is part of the Semiconductor Transport class.
Scattering rates of confined carriers
20 Jun 2011 | Teaching Materials | Contributor(s): Dragica Vasileska
Scattering rates of acoustic phonon scattering and interface roughness are described for a case of 1D confinement.
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