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Tags: interface roughness

All Categories (1-9 of 9)

  1. Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

    25 Mar 2014 | Presentation Materials | Contributor(s): Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik

    The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing...

    http://nanohub.org/resources/20737

  2. Kelvin Wei Siang NG

    http://nanohub.org/members/71086

  3. Growth of Cu films on hydrogen terminated Si(lQ0) and Si(lll) surf&es

    07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, R. Naik, G. Auner, C. Kota, U. Rao

    We have employed reflection high energy electron diffraction (RHEED) and high resolution transmission electron microscopy (HREM) to study Cu films grown on hydrogen terminated Si( 100) and Si(...

    http://nanohub.org/resources/12235

  4. Confined Carriers - Interface Roughness Scattering

    30 Jun 2011 | Teaching Materials | Contributor(s): Dragica Vasileska

    This set of handwritten notes is part of the Semiconductor Transport class.

    http://nanohub.org/resources/11534

  5. Scattering rates of confined carriers

    20 Jun 2011 | Teaching Materials | Contributor(s): Dragica Vasileska

    Scattering rates of acoustic phonon scattering and interface roughness are described for a case of 1D confinement.

    http://nanohub.org/resources/11413

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