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Tags: I-V curves

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  1. ECE 606 Lecture 22: MOScap Frequence Response/MOSFET I-V Characteristics

    26 Nov 2012 | Online Presentations | Contributor(s): Gerhard Klimeck

    http://nanohub.org/resources/15977

  2. ECE 606 Lecture 23: MOSFET I-V Characteristics/MOSFET Non-Idealities

    26 Nov 2012 | Online Presentations | Contributor(s): Gerhard Klimeck

    http://nanohub.org/resources/15978

  3. ECE 606 Lecture 24: MOSFET Non-Idealities

    26 Nov 2012 | Online Presentations | Contributor(s): Gerhard Klimeck

    http://nanohub.org/resources/15979

  4. Nanoscale Transistors Lecture 2: IV Characteristics - traditional approach

    19 Jul 2012 | Online Presentations | Contributor(s): Mark Lundstrom

    http://nanohub.org/resources/14761

  5. Solar Cells Lecture 1: Introduction to Photovoltaics

    19 Aug 2011 | Online Presentations | Contributor(s): Mark Lundstrom

    An introduction to solar cells covering the basics of PN junctions, optical absorption, and IV characteristics. Key technology options and economic considers are briefly presented.

    http://nanohub.org/resources/11875

  6. FETToy

    14 Feb 2006 | Tools | Contributor(s): Anisur Rahman, Jing Wang, Jing Guo, Md. Sayed Hasan, Yang Liu, Akira Matsudaira, Shaikh S. Ahmed, Supriyo Datta, Mark Lundstrom

    Calculate the ballistic I-V characteristics for conventional MOSFETs, Nanowire MOSFETs and Carbon NanoTube MOSFETs

    http://nanohub.org/resources/fettoy

  7. Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

    24 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10521

  8. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Introduction to Device Characterization - System Overview: System Architecture, Hardware Features and Software Features - Precision DC I-V Source-Measure Features and Concepts.

    http://nanohub.org/resources/10387

  9. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10388

  10. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10389

  11. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10390

  12. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10391

  13. Keithley 4200-SCS Lecture 06: Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10392

  14. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10430

  15. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Theory of Operation and Measurement Overview

    http://nanohub.org/resources/10431

  16. Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    http://nanohub.org/resources/10432

  17. Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    http://nanohub.org/resources/10433

  18. Keithley 4200-SCS: KITE Demo

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10429

  19. Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    http://nanohub.org/resources/10480

  20. Device Characterization with the Keithley 4200-SCS

    20 Jan 2011 | Courses | Contributor(s): Lee Stauffer

    This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument,...

    http://nanohub.org/resources/10386

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