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Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization
24 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10521
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Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
Introduction to Device Characterization - System Overview: System Architecture, Hardware Features and Software Features - Precision DC I-V Source-Measure Features and Concepts.
https://nanohub.org/resources/10387
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Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10388
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Keithley 4200-SCS Lecture 03: More KITE Setup and Features
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10389
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Keithley 4200-SCS Lecture 04: Speed and Timing Considerations
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10390
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Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10391
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Keithley 4200-SCS Lecture 06: Troubleshooting
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10392
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Keithley 4200-SCS Lecture 07: KCON Utility Overview
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10430
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Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
Theory of Operation and Measurement Overview
https://nanohub.org/resources/10431
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Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
Measurement Techniques and Optimization
https://nanohub.org/resources/10432
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Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
Measurement Techniques and Optimization
https://nanohub.org/resources/10433
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Keithley 4200-SCS: KITE Demo
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10429
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Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
https://nanohub.org/resources/10480
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Device Characterization with the Keithley 4200-SCS
20 Jan 2011 | Courses | Contributor(s): Lee Stauffer
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as …
https://nanohub.org/resources/10386
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Lee Stauffer
Lee Stauffer has been with Keithley Instruments for 22 years. In that time, he has filled roles in applications engineering, technology development and business development. His current role is …
https://nanohub.org/members/48957