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Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | | Contributor(s):: Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.
Fahad Al Mamun
Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films
07 Oct 2011 | | Contributor(s):: Brian Demczyk, V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner
We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy onhydrogen-terminated @100# silicon substrates.
Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films
25 Mar 2014 | | Contributor(s):: Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik
The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...
Jose Francisco Barron-Lopez
Magnetic properties of magnetron sputtered Co-Cr thin films
07 Oct 2011 | | Contributor(s):: Brian Demczyk, J. O. Artman
The magnetic properties 01 magnetron sputtered CO-22 at.% Cr films of various thickness deposited on glass have been examined, with particular attentionto the various contributions to the film anisotropy
Origin of the orientation ratio in sputtered longitudinal media
07 Oct 2011 | | Contributor(s):: Brian Demczyk, J. N. Zhou, G. Choe, E. Stach, E. C. Nelson, U. Dahmen
The surface morphology, thin film microstructure, and crystallography of sputtered longitudinalmedia were examined by atomic force and transmission electron microscopy.
Oxidation Behavior of CoCr Thin Films
07 Oct 2011 | | Contributor(s):: Brian Demczyk
In this work, elemental redistribution of annealed CoCr thin films has been investigated by X-ray photoelectron spectroscopy.
Rajesh kumar R