Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
Aug 12 2019
ICANM2019:7th International Conference & Exhibition on Advanced & Nano Materials
ABACUS—Introduction to Semiconductor Devices
When we hear the term semiconductor device, we may think first of the transistors in PCs or video game consoles, but transistors are the basic component in all of the electronic devices we use in...
Complex Oxides and the Philosopher’s Stone
26 May 2016 | | Contributor(s):: Shiram Ramanathan
In this talk I will discuss the topic of insulator-metal transitions in strongly correlated oxides, their control via disorder, orbital occupancy and electric fields and challenges these systems pose to our contemporary understanding of emergent phenomena in ionic lattices.
IMA 2013 UQ: Bayesian Calibration of Molecular Dynamics Simulations for Composite Materials Properties
28 May 2014 | | Contributor(s):: Paul N. Patrone
In this talk, I discuss ongoing research whose goal is to determine, via Bayesian inference, an ensemble of inputs that represents a class of commercially important amine-cured epoxies. We construct an analytical approximation (i.e. a surrogate or emulator) of the simulations, treating the input...
IMA 2013 UQ: Foam Property Prediction from Process Modeling
28 May 2014 |
We are developing computational models to elucidate the injection, expansion, and dynamic filling process for polyurethane foam such as PMDI. The polyurethane is a chemically blown foam, where carbon dioxide is produced via reaction of water, the blowing agent, and isocyanate. In a competing...
[Illinois] CSE Seminar Series: Advances in First-principles Computational Materials Science
20 Nov 2012 | | Contributor(s):: Elif Ertekin
Title: Advances in first-principles computational materials scienceSubtitle: Things we can calculate now, that we couldn't when I was in grad school.The capability to rationally design new materials with tailored properties and functionality on a computer remains a grand challenge whose success...
Jason Arthur Merz
Carbon NanoTubes: Structure - Properties - Applications
19 Mar 2012 | | Contributor(s):: Yuri A Kruglyak
Presentation slides for seminar given for students of Faculty of Computer Sciences of Odessa State Environmental University, Ukraine by Prof. Yuri Kruglyak on May 22, 2008.
Direct mechanical measurement of the tensile strength and elastic modulus of multiwalled carbon nanotubes
07 Oct 2011 | | Contributor(s):: Brian Demczyk, Y.M. Wang, J. Cumings, M. Hetman, W. Han, A. Zettl. R. O. Ritchie
This work represents the first in-situ measurenment of the tensile strength of a carbon nanotuube.
In-situ carbon nanotube tensile test
07 Oct 2011 | | Contributor(s):: Brian Demczyk
This represents the first in-situ tensile test observed in a transmission electron microscope.
Magnetic properties of magnetron sputtered Co-Cr thin films
07 Oct 2011 | | Contributor(s):: Brian Demczyk, J. O. Artman
The magnetic properties 01 magnetron sputtered CO-22 at.% Cr films of various thickness deposited on glass have been examined, with particular attentionto the various contributions to the film anisotropy
Experiments and Models Regarding Strain Dependent Thermal Conductivity and Strength at the Nanoscale and Microscale
22 Sep 2011 | | Contributor(s):: Vikas Tomar
Silicon micro- and nano-structures are essential in today’s integrated circuits and sensors. The functioning and performance of such devices are highly affected by thermal properties. Due to the size effect, the thermal properties of bulk silicon cannot represent those of silicon...
CHM 696 Lecture 14: Semiconductor Nanoparticles, Nanorods, and Nanowires: Properties and Applications I
02 Jun 2011 | | Contributor(s):: Alexander Wei
CHM 696 Lecture 15: Semiconductor Nanoparticles, Nanorods, and Nanowires: Properties and Applications II
AFM Metrology of Cellulose Nanocrystals
03 May 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
Electronic Characterization of Materials Using Conductive AFM
03 May 2011 | | Contributor(s):: Amir Moshar