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Tags: Materials Characterization

Resources (1-2 of 2)

  1. X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials

    29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela

    A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the...

    http://nanohub.org/resources/7955

  2. Illinois ME 498 Introduction of Nano Science and Technology, Lecture 18: Enabling tools for Characterization of Nanoscale Materials

    17 Nov 2009 | Online Presentations | Contributor(s): Nick Fang, Omar N Sobh

    Enabling tools for nanoscale materials Topics: Vapor - Liquid - Solid Nanowire Growth Anodizing Alumina as Template Sensing with Nanowires Imagning with Energy Beams Scanning...

    http://nanohub.org/resources/7843

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