Tags: Materials Characterization

All Categories (1-11 of 11)

  1. Himanshu Patel

    http://nanohub.org/members/198194

  2. Túlio André Pereira

    http://nanohub.org/members/176277

  3. Milad Yarali

    http://nanohub.org/members/173671

  4. Matthew Glen Robertson

    http://nanohub.org/members/149764

  5. Andrew Joseph O'Connor

    http://nanohub.org/members/124665

  6. Gustavo Medeiros Azevedo

    http://nanohub.org/members/117712

  7. Vaibhav Jayaraman

    http://nanohub.org/members/114032

  8. Michael James Walock

    http://nanohub.org/members/60785

  9. Tonio Buonassisi

    Tonio Buonassisi is author of over 110 journal, conference, and workshop articles focused on photovoltaics. He received his Ph.D. from the University of California, Berkeley in 2006, where he...

    http://nanohub.org/members/54157

  10. X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials

    29 Dec 2009 | | Contributor(s):: Mauro Sardela

    A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the Birck Nanotechnology Center. Practical aspects of data acquisition and interpretation using x-ray...

  11. Illinois ME 498 Introduction of Nano Science and Technology, Lecture 18: Enabling tools for Characterization of Nanoscale Materials

    17 Nov 2009 | | Contributor(s):: Nick Fang, Omar N Sobh

    Enabling tools for nanoscale materialsTopics: Vapor - Liquid - Solid Nanowire Growth Anodizing Alumina as Template Sensing with Nanowires Imagning with Energy Beams Scanning electron Microscopy (SEM) Electron Sources Field Emission Principle Limitations of the Beam Size Liquid Metal Ion Source...