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Taking a Closer Look at Objects
11 Jan 2017 | Teaching Materials | Contributor(s): Georgia Institute of Technology
For students to understand their world they often need to use tools to gather information. Some tools will help them see parts of their surrounding world that they would otherwise miss....
[Illinois] AMC 2016 workshop: In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force microscope
13 Jun 2016 | Online Presentations | Contributor(s): Song Xu
Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign
[Illinois] AMC 2016 workshop: Cryogen-Free Scanning Probe Microscopy: the solution for atomic scale surface science below 10 Kelvin without liquid helium
13 Jun 2016 | Online Presentations | Contributor(s): Craig Wall
NEATEC & Trinity College - Module 2 - Microscopy
23 Apr 2013 | Teaching Materials | Contributor(s): Trinity College Dublin, NEATEC Developers
Northeast Technological Education Center (NEATEC) Hudson Valley Community College STEM Introduction Topic Microscopy Secondary Level - Grades 9th-12th – Assessment NEATEC Mission Statement:...
2010 Nano-Biophotonics Summer School @ UIUC Lecture 4 - Gaussian beam propagation - Elastic light scattering - Dynamic light scattering
25 Sep 2010 | Online Presentations | Contributor(s): Gabriel Popescu
Often, experiments involve light beams. A light beam can be defined as a distribution of field that fulfills the approximation in Eq. 20,
i.e. is characterized by a dominant wave vector...
Illinois ECE 460 Optical Imaging, Chapter 4: Microscopy
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29 Jul 2008 | Teaching Materials | Contributor(s): Gabriel Popescu, Andre da Costa, Christopher Nixon, Glen Svenningsen
This chapter presents the main concepts and techniques of Microscopy: Resolution, Contrast, Dark Field Microscopy, Schlieren Method, Phase Contrast Microscopy, Quantitative Phase Microscopy and...
Lecture 8: Resolutions
10 Apr 2008 | Online Presentations | Contributor(s): Paul R Selvin
X-ray diffraction (atomic resolution)
Electron (Imaging) Microscopy (nm-scale)
Visible (Imaging) Microscopy (nm - µm)