
ECE 695A Lecture 13R: Review Questions
19 Feb 2013  Online Presentations  Contributor(s): Muhammad Alam
Review Questions:
Both SiH and SiO are involved in HCI degradation. Give two evidences.
Why doesn’t HCI occur during NBTI stress condition?
I suggested that HCI curve can shifted...
http://nanohub.org/resources/16888

ECE 606 Lecture 21: MOS Electrostatics
26 Nov 2012  Online Presentations  Contributor(s): Gerhard Klimeck
http://nanohub.org/resources/15976

ECE 606 Lecture 22: MOScap Frequence Response/MOSFET IV Characteristics
26 Nov 2012  Online Presentations  Contributor(s): Gerhard Klimeck
http://nanohub.org/resources/15977

Uniform Methodology of Benchmarking BeyondCMOS Devices
31 Oct 2012  Online Presentations  Contributor(s): Dmitri Nikonov
Multiple logic devices are presently under study within the Nanoelectronic Research Initiative (NRI) to carry the development of integrated circuits beyond the CMOS roadmap. Structure and...
http://nanohub.org/resources/15674

Nanoscale Transistors Lecture 4: MOS Electrostatics
19 Jul 2012  Online Presentations  Contributor(s): Mark Lundstrom
http://nanohub.org/resources/14763

Illinois ECE 440 Solid State Electronic Devices, Lecture 33: MOS Capacitance
02 Mar 2010  Online Presentations  Contributor(s): Eric Pop
…
http://nanohub.org/resources/8570

Illinois ECE 440 Solid State Electronic Devices, Lecture 32: MOS Threshold Voltage
02 Mar 2010  Online Presentations  Contributor(s): Eric Pop
…
http://nanohub.org/resources/8573

Illinois ECE 440 Solid State Electronic Devices, Lecture 31: MOS Capacitor
02 Mar 2010  Online Presentations  Contributor(s): Eric Pop
…
http://nanohub.org/resources/8576

Illinois ECE 440 Solid State Electronic Devices, Lecture 30: Intro MOS Transistor
02 Mar 2010  Online Presentations  Contributor(s): Eric Pop
…
http://nanohub.org/resources/8579

ECE 606 Lecture 33: MOS Electrostatics II
16 Apr 2009  Online Presentations  Contributor(s): Muhammad A. Alam
http://nanohub.org/resources/5896

ECE 606 Lecture 34: MOSCAP Frequency Response
16 Apr 2009  Online Presentations  Contributor(s): Muhammad A. Alam
http://nanohub.org/resources/5898

ECE 606 Lecture 32: MOS Electrostatics I
19 Nov 2008  Online Presentations  Contributor(s): Muhammad A. Alam
http://nanohub.org/resources/5894

ECE 606 Lecture 26: Schottky Diode II
19 Nov 2008  Online Presentations  Contributor(s): Muhammad A. Alam
http://nanohub.org/resources/5830

Quantum and Thermal Effects in Nanoscale Devices
18 Sep 2008  Online Presentations  Contributor(s): Dragica Vasileska
To investigate lattice heating within a Monte Carlo device simulation framework, we simultaneously solve the Boltzmann transport equation for the electrons, the 2D Poisson equation to get the...
http://nanohub.org/resources/5448

ECE 612 Lecture 3: MOS Capacitors
09 Sep 2008  Online Presentations  Contributor(s): Mark Lundstrom
Outline: 1) Short review,
2) Gate voltage / surface potential relation,
3) The flatbandvoltage,
4) MOS capacitance vs. voltage,
5) Gate voltage and inversion layer charge.
http://nanohub.org/resources/5363

New Dimension in Performance: Harnessing 3D Integration Technology
29 Nov 2007  Online Presentations  Contributor(s): Kerry Bernstein
Despite generation on generation of scaling, computer chips have remained essentially 2dimensional. Improvements in onchip wire delay, and in the total number of inputs and outputs has not been...
http://nanohub.org/resources/3596

CMOS Nanotechnology
25 May 2005  Online Presentations  Contributor(s): Mark Lundstrom
In nonspecialist language, this talk introduces CMOS technology used for modern electronics. Beginning with an explanation of "CMOS," the speaker relates basic system considerations of transistor...
http://nanohub.org/resources/166

Digital Electronics: Fundamental Limits and Future Prospects
13 Apr 2004  Online Presentations  Contributor(s): Konstantin K. Likharev
I will review some old and some recent work on the fundamental (and not so fundamental) limits imposed by physics of electron devices on their density and power consumption.
http://nanohub.org/resources/149