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The metal–oxide–semiconductor field-effect transistor is a device used for amplifying or switching electronic signals. In MOSFETs, a voltage on the oxide-insulated gate electrode can induce a conducting channel between the two other contacts called source and drain. The channel can be of n-typeor p-type, and is accordingly called an nMOSFET or a pMOSFET (also commonly nMOS, pMOS). It is by far the most common transistor in both digital and analog circuits, though the bipolar junction transistor was at one time much more common. More information on MOSFET can be found here.

Online Presentations (21-40 of 46)

  1. ECE 606 Lecture 40: Looking Back and Looking Forward

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    30 Apr 2009 | Online Presentations

    https://nanohub.org/resources/6716

  2. ECE 606 Lecture 37b: Nonideal Effects in MOSFET II

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    28 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/5826

  3. ECE 606 Lecture 36: MOSFET I-V Characteristics II

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    28 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/5902

  4. ECE 606 Lecture 37a: Nonideal Effects in MOSFET I

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    28 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/5904

  5. ECE 606 Lecture 35: MOSFET I-V Characteristics I

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    16 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/5900

  6. ECE 612 Lecture 26: Heterostructure FETs

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    10 Dec 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    Outline: 1) Introduction, 2) Heterojunction review, 3) Modulation doping, 4) I-V characteristics, 5) Device Structure / Materials, 6) Summary.

    https://nanohub.org/resources/6032

  7. ECE 612 Lecture 18B: CMOS Process Flow

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    18 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    For a basic, CMOS process flow for an STI (shallow trench isolation process), see: http://www.rit.edu/~lffeee/AdvCmos2003.pdf. This lecture is a condensed version of the more complete presentation …

    https://nanohub.org/resources/5855

  8. ECE 612 Lecture 18A: CMOS Process Steps

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    12 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    Outline: 1) Unit Process Operations, 2) Process Variations.

    https://nanohub.org/resources/5788

  9. ECE 612 Lecture 8: Scattering Theory of the MOSFET II

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    08 Oct 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    Outline: 1) Review and introduction, 2) Scattering theory of the MOSFET, 3) Transmission under low VDS, 4) Transmission under high VDS, 5) Discussion, 6) Summary.

    https://nanohub.org/resources/5368

  10. ECE 612 Lecture 7: Scattering Theory of the MOSFET I

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    08 Oct 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    Outline: 1) Review and introduction, 2) Scattering theory of the MOSFET, 3) Transmission under low VDS, 4) Transmission under high VDS, 5) Discussion, 6) Summary.

    https://nanohub.org/resources/5367

  11. Introductory Comments

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    29 Sep 2008 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/5502

  12. Lecture 7: Connection to the Bottom Up Approach

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    23 Sep 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    While the previous lectures have been in the spirit of the bottom up approach, they did not follow the generic device model of Datta. In this lecture, the ballistic MOSFET theory will be formally …

    https://nanohub.org/resources/5314

  13. Lecture 3A: The Ballistic MOSFET

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    10 Sep 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    The IV characteristic of the ballistic MOSFET is formally derived. When Boltzmann statistics are assumed, the model developed here reduces to the one presented in Lecture 2. There is no new physics …

    https://nanohub.org/resources/5309

  14. Lecture 3B: The Ballistic MOSFET

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    10 Sep 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    This lecture is a continuation of part 3A. After discussion some bandstructure considerations, it describes how 2D and subthreshold electrostatics are included in the ballistic model.

    https://nanohub.org/resources/5310

  15. Physics of Nanoscale Transistors: An Introduction to Electronics from the Bottom Up

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    10 Sep 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    Transistor scaling has pushed channel lengths to the nanometer regime, and advances in nanoscience have opened up many new possibilities for devices. To realize these opportunities, our traditional …

    https://nanohub.org/resources/5207

  16. Lecture 2: Elementary Theory of the Nanoscale MOSFET

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    08 Sep 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    A very simple (actually overly simple) treatment of the nanoscale MOSFET. This lecture conveys the essence of the approach using only simple mathematics. It sets the stage for the subsequent …

    https://nanohub.org/resources/5308

  17. Lecture 4: Scattering in Nanoscale MOSFETs

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    08 Sep 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    No MOSFET is ever fully ballistic - there is always some carrier scattering. Scattering makes the problem complicated and requires detailed numerical simulations to treat properly. My objective in …

    https://nanohub.org/resources/5311

  18. Lecture 5: Application to State-of-the-Art FETs

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    08 Sep 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    The previous lessons may seem a bit abstract and mathematical. To see how this all works, we examine measured data and show how the theory presented in the previous lessons help us understand the …

    https://nanohub.org/resources/5312

  19. Introduction: Physics of Nanoscale MOSFETs

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    26 Aug 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    NCN@Purdue Summer School 2008 National Science Fondation Intel Corporation NCN@Purdue Summer School 2008 National Science Fondation Intel Corporation

    https://nanohub.org/resources/5317

  20. Lecture 1: Review of MOSFET Fundamentals

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    26 Aug 2008 | Online Presentations | Contributor(s): Mark Lundstrom

    A quick review of the traditional theory of the MOSFET along with a review of key device performance metrics. A short discussion of the limits of the traditional (drift-diffusion) approach and the …

    https://nanohub.org/resources/5307

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