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A Matlab 2D-Poisson-drift-diffusion simulator for semiconductor devices
04 Mar 2024 | | Contributor(s):: Chien-Ting Tung
A Matlab 2D-Poisson-Drift-Diffusion solver for simple MOSFETs. It uses finite difference method, Slotboom variable, and Gummel iteration.Boltzmann statistics and velocity saturation is considered.
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Where can I find an example for the simulation of a standard 4 terminal MOSFET?
Q&A|Open | Responses: 3
https://nanohub.org/answers/question/2717
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Teakhoon Lim
https://nanohub.org/members/278747
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Need to hire a nanohub freelancer to model a graphene OFET, vertical transistor -- fees MOSFET
Q&A|Closed | Responses: 2
I need to hire a freelancer to model and predict a FET.
I am not familiar with FETTOY.
You will use a program like FETTOY to help us optimize the design of a FET...
https://nanohub.org/answers/question/2033
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Nikolaos Makris
https://nanohub.org/members/160697
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A Verilog-A Compact Model for Negative Capacitance FET
28 Nov 2015 | Compact Models | Contributor(s):
By Muhammad Abdul Wahab1, Muhammad A. Alam1
Purdue University
The NC-FET compact model is a semi-physical verilog-A model of the negative capacitance transistor. We developed this self-consistent model with BSIM4/MVS and Landau theory. This model is useful to...
https://nanohub.org/publications/95/?v=1
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Gaurav Dhiman
https://nanohub.org/members/131673
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how to simulate insulator in a GNRFET with matlab?
Q&A|Closed | Responses: 0
I want to apply gate voltage on a graphene nanoribbon as a channel in a GNRFET. then I want to solve poisson equation but I need to know the voltage on channel as the boundary...
https://nanohub.org/answers/question/1583
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Neel Chatterjee
https://nanohub.org/members/118363
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Hybrid CMOS/SET models for PSpice?
Q&A|Closed | Responses: 2
Hello! Can anyone tell me where can I find models for hybrid transistors (CMOS and Sinlgle Electron) for designing circuits in PSpice? I must find them for my homework. Thank you!
https://nanohub.org/answers/question/1404
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How exactly PN junction works?
Q&A|Closed | Responses: 0
I know the conventional explanation that electrons moves from n- side and holes from p-side etc but i know that holes is nothing but the absence of electron. So i want to know the working of P-N...
https://nanohub.org/answers/question/1341
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Sabbir Ebna Razzaque
https://nanohub.org/members/67938
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling
28 Mar 2012 | | Contributor(s):: Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)
28 Mar 2012 | | Contributor(s):: Souvik Mahapatra
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)
28 Mar 2012 | | Contributor(s):: Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)
28 Mar 2012 | | Contributor(s):: Souvik Mahapatra
This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner...
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Bhupesh Bishnoi
https://www.iitk.ac.in/new/bhupesh-bishnoi
https://nanohub.org/members/62512
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Hasan Munir Nayfeh
Dr. Hasan M. Nayfeh is a senior engineer at IBM SRDC (East Fishkill, New York). He received his Ph.D. (2003) in Electrical Engineering in the area of strained silicon devices from MIT (Cambridge,...
https://nanohub.org/members/56927
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Keerti Kumar Korlapati
https://nanohub.org/members/55518
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)
11 May 2011 | | Contributor(s):: Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to...