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Progress in technology has brought microelectronics to the nanoscale, but nanoelectronics is not yet a well-defined engineering discipline with a coherent, experimentally verified, theoretical framework. The NCN has a vision for a new, 'bottom-up' approach to electronics, which involves: understanding electronic conduction at the atomistic level; formulating new simulation techniques; developing a new generation of software tools; and bringing this new understanding and perspective into the classroom. We address problems in atomistic phenomena, quantum transport, percolative transport in inhomogeneous media, reliability, and the connection of nanoelectronics to new problems such as biology, medicine, and energy. We work closely with experimentalists to understand nanoscale phenomena and to explore new device concepts. In the course of this work, we produce open source software tools and educational resources that we share with the community through the nanoHUB.

This page is a starting point for nanoHUB users interested in nanoelectronics. It lists key resources developed by the NCN Nanoelectronics team. The nanoHUB contains many more resources for nanoelectronics, and they can be located with the nanoHUB search function. To find all nanoelectronics resources, search for 'nanoelectronics.' To find those contributed by the NCN nanoelectronics team, search for 'NCNnanoelectronics.' More information on Nanoelectronics can be found here.

Online Presentations (1-20 of 892)

  1. ECE 695A Lecture 37: Radiation Induced Damage – An overview

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    20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction and short history of radiation damage Radiation damage in various types of components Sources of radiation A basic calculation and simulation approaches Conclusions

    https://nanohub.org/resources/17638

  2. ECE 695A Lecture 37R: Review Questions

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    20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET? What type of radiation issues could arise for thin-body devices …

    https://nanohub.org/resources/17639

  3. ECE 695A Lecture 33: Model Selection/Goodness of Fit

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    18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: The problem of matching data with theoretical distribution Parameter extractions: Moments, linear regression, maximum likelihood Goodness of fit: Residual, Pearson, Cox, Akika …

    https://nanohub.org/resources/17615

  4. ECE 695A Lecture 33R: Review Questions

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    18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: With higher number of model parameters, you can always get a good fit – why should you minimize the number of parameters Least square method is a subset of maximum likelihood …

    https://nanohub.org/resources/17616

  5. ECE 695A Lecture 32R: Review Questions

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    17 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why do people use Normal, log-normal, Weibull distributions when they do not know the exact physical distribution? What is the problem of using empirical distributions? What are …

    https://nanohub.org/resources/17586

  6. ECE 695A Lecture 32: Physical vs. Empirical Distribution

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    17 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Physical Vs. empirical distribution Properties of classical distribution function Moment-based fitting of data Conclusions

    https://nanohub.org/resources/17585

  7. ECE 695A Lecture 31R: Review Questions

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    15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is the difference between parametric estimation vs. non-parametric estimation? What principle did Tacho Brahe’s approach assume? What is the difference between …

    https://nanohub.org/resources/17584

  8. ECE 695A Lecture 31: Collecting and Plotting Data

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    15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Origin of data, Field Acceleration vs. Statistical Inference Nonparametric information Preparing data for projection: Hazen formula Preparing data for projection: Kaplan formula …

    https://nanohub.org/resources/17582

  9. ECE 695A Lecture 31A: Appendix - Bootstrap Method Introduction

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    15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    …

    https://nanohub.org/resources/17583

  10. ECE 695A Lecture 30R: Review Questions

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    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: What is the difference between extrinsic vs. intrinsic breakdown? Does gas dielectric have extrinsic breakdown? Why or why not? What does ESD damage and the plasma damage to thin …

    https://nanohub.org/resources/17487

  11. ECE 695A Lecture 30: Breakdown in Dielectrics with Defects

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    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction Theory of pre-existing defects: Thin oxides Theory of pre-existing defects: thick oxides Conclusions

    https://nanohub.org/resources/17486

  12. ECE 695A Lecture 29R: Review Questions

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    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Mention a few differences between thick and thin oxide breakdown. Is breakdown in thick oxides contact dominated? Can I use AHI theory here? How does the Paschen’s cascade …

    https://nanohub.org/resources/17485

  13. ECE 695A Lecture 29A: Appendix - Dimension of a Surface

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    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    …

    https://nanohub.org/resources/17484

  14. ECE 695A Lecture 28: Circuit Implications of Dielectric Breakdown

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    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Part 1 - Understanding Post-BD FET behavior BD position determination Hard and Soft BD in FETs Distinguishing leakage and intrinsic FET parameters shifts Part 2 - Impact of …

    https://nanohub.org/resources/17482

  15. ECE 695A Lecture 29: Circuit Implications of Dielectric Breakdown

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    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction Spatial and temporal dynamics during breakdown Breakdown in bulk oxides: puzzle Conclusions

    https://nanohub.org/resources/17483

  16. ECE 695A Lecture 27R: Review Questions

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    29 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    …

    https://nanohub.org/resources/17448

  17. ECE 695A Lecture 26-1: Statistics of Soft Breakdown via Methods of Markov Chains

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    28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Spatial vs. Temporal correlation Theory of correlated Dielectric Breakdown Excess leakage as a signature of correlated BD Conclusions

    https://nanohub.org/resources/17418

  18. ECE 695A Lecture 26-2: Statistics of Soft Breakdown (Breakdown Position correlation)

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    28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Position and time correlation of BD spot How to determine the position of the BD Spot Position correlation in BD spots Why is localization so weak? Conclusions

    https://nanohub.org/resources/17419

  19. ECE 695A Lecture 26R: Review Questions

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    28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    …

    https://nanohub.org/resources/17420

  20. Carbon-Based Nanoswitch Logic

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    28 Mar 2013 | Online Presentations | Contributor(s): Stephen A. Campbell

    This talk discusses a rather surprising possibility: the use of carbon-based materials such as carbon nanotubes and grapheneto make nanomechanical switches with at least an order of magnitude lower …

    https://nanohub.org/resources/17328

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