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Introduction to the Keldysh Nonequilibrium Green Function Technique
06 Oct 2006 | | Contributor(s):: A. P. Jauho
Keldysh nonequilibrium Green function technique is used very widely to describe transport phenomena in mesoscopic systems.The technique is somewhat subtle, and a rigorous treatment would require much more than we have at our disposal, see, for example, the text-bookk by Haug and Jauho [1].The...
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nanoMOS 2.0: A Two -Dimensional Simulator for Quantum Transport in Double-Gate MOSFETs
06 Oct 2006 | | Contributor(s):: Zhibin Ren, Ramesh Venugopal, Sebastien Goasguen, Supriyo Datta, Mark Lundstrom
A program to numerically simulate quantum transport in double gate MOSFETs is described. The program uses a Green’s function approach and a simple treatment of scattering based on the idea of so-called Büttiker probes. The double gate device geometry permits an efficient mode space approach that...
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ECE 612 Lecture 16: 2D Electrostatics, Part II
02 Oct 2006 | | Contributor(s):: Mark Lundstrom
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ECE 612 Lecture 15: 2D Electrostatics, Part I
02 Oct 2006 | | Contributor(s):: Mark Lundstrom
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ECE 612 Lecture 14: Effective Mobility
02 Oct 2006 | | Contributor(s):: Mark Lundstrom
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Simulating Quantum Transport in Nanoscale Transistors: Real versus Mode-Space Approaches
28 Sep 2006 | | Contributor(s):: Zhibin Ren, Supriyo Datta, Mark Lundstrom, Ramesh Venugopal, D. Jovanovic
In this paper, we present a computationally efficient, two-dimensional quantum mechanical sim- ulation scheme for modeling electron transport in thin body, fully depleted, n-channel, silicon- on-insulator transistors in the ballistic limit. The proposed simulation scheme, which solves the...
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Device Physics and Simulation of Silicon Nanowire Transistors
28 Sep 2006 | | Contributor(s):: Jing Wang
As the conventional silicon metal-oxide-semiconductor field-effect transistor (MOSFET) approaches its scaling limits, many novel device structures are being extensively explored. Among them, the silicon nanowire transistor (SNWT) has attracted broad attention from both the semiconductor industry...
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ECE 612 Lecture 12: Subthreshold Conduction
25 Sep 2006 | | Contributor(s):: Mark Lundstrom
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ECE 612 Lecture 8: MOSFET IV, Part II
11 Sep 2006 | | Contributor(s):: Mark Lundstrom
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ECE 612 Lecture 10: The Ballistic MOSFET
18 Sep 2006 | | Contributor(s):: Mark Lundstrom
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ECE 612 Lecture 11: The Quasi-ballistic MOSFET
18 Sep 2006 | | Contributor(s):: Mark Lundstrom
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Nanoscale Device Modeling: From MOSFETs to Molecules
20 Sep 2006 | | Contributor(s):: Prashant Subhash Damle
This thesis presents a rigorous yet practical approach to model quantum transport in nanoscale electronic devices.As convetional metal oxide semiconductor devices shrink below the one hundred nanometer regime, quantum mechanical effects are beginning to play an increasingly important role in...
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Towards Multi-Scale Modeling of Carbon Nanotube Transistors
20 Sep 2006 | | Contributor(s):: Jing Guo, Supriyo Datta, Mark Lundstrom, M. P. Anantram
Multiscale simulation approaches are needed in order to address scientific and technological questions in the rapidly developing field of carbon nanotube electronics. In this paper, we describe an effort underway to develop a comprehensive capability for multiscale simulation of carbon nanotube...
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Quantum Transport for Nanostructures
17 Sep 2006 | | Contributor(s):: Mathieu Luisier
Nonequilibrium Green's function techniques, initiated by Schwinger and Kadanoff and Baym allow ones to study the time evolution of a many-particle quantum sys- tem. Knowing the 1-particle Green's functions of a given system, one may evaluate 1-particle quantities like carrier density or...
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ECE 612 Lecture 7: MOSFET IV, Part I
11 Sep 2006 | | Contributor(s):: Mark Lundstrom
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ECE 612 Lecture 6: Quantum Mechanical Effects
05 Sep 2006 | | Contributor(s):: Mark Lundstrom
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ECE 612 Lecture 9: MOSFET IV, Part III
12 Sep 2006 | | Contributor(s):: Mark Lundstrom
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ECE 612 Lecture 5: Poly Si Gate MOS Capacitors
05 Sep 2006 | | Contributor(s):: Mark Lundstrom
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ECE 612 Lecture 4: MOS Capacitors
05 Sep 2006 | | Contributor(s):: Mark Lundstrom
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Modeling Interface-defect Generation (MIG)
18 Jul 2006 | | Contributor(s):: Ahmad Ehteshamul Islam, HALDUN KUFLUOGLU, Muhammad A. Alam
Analyzes device reliability based on NBTI