
Introduction to Compact Models and Circuit Simulation
21 Jun 2013   Contributor(s):: Jaijeet Roychowdhury
With NEEDS introduction by Mark Lundstrom. This talk contains a brief introduction to VerilogA and suggests some initial guidelines for writing VerilogA versions of NEEDS models.

Introduction to Compact Models and Circuit Simulation
19 Jun 2013   Contributor(s):: Tianshi Wang, Jaijeet Roychowdhury
The presentation is a gentle introduction to compact models, basic circuit simulation concepts, and flows for developing compact models. The roadmap for the NEEDSSPICE platform, being developed to ease the process of developing simulationready compact models for novel nanodevices, is briefly...

Guidelines for Writing NEEDScertified VerilogA Compact Models
19 Jun 2013   Contributor(s):: Tianshi Wang, Jaijeet Roychowdhury
This talk contains a brief introduction to VerilogA and suggests some initial guidelines for writing VerilogA versions of NEEDS models. For more about the history of VerilogA and additional guidelines for writing VerilogA models, see the presentation by Drs. Geoffrey Coram and Colin McAndrew.

NEEDS Introduction
19 Jun 2013   Contributor(s):: Mark Lundstrom
NEEDS is an initiative supported by the National Science Foundation and the Semiconductor Research Corporation with a mission to develop the critical missing link needed to transform nanoelectronic materials and device research into electronic systems – physicsbased compact models for...

NEEDS Workshop on Compact Modeling
19 Jun 2013   Contributor(s):: Mark Lundstrom, Jaijeet Roychowdhury
Advanced inresearch promise a new era of electronics – one that harnesses the capabilities of novel nano‐engineered materials and devices either alone or in conjunction with powerful silicon platforms. Compact models connect basic work on materials and device physics to circuits and systems....

VerilogA: Present Status and Guidelines
19 Jun 2013   Contributor(s):: Geoffrey Coram
VerilogA is the standard language for compact model development and implementation.This talk provides some background on the rationale for and development of VerilogA,summarizes the current status of the language, and provides a short introduction andsome tips for writing good compact models...

nanoWind Installation files
10 Jun 2013   Contributor(s):: Tianwei Liu, Joseph M. Cychosz
nanoWind is a Microsoft Office 2007 plugin designed to generate scripts for HUBpresenter using Final Cut XML, PowerPoint voicenarration or Adobe Presenter Project(aka. Breeze).

TEM Lattice Calculator
17 May 2013   Contributor(s):: Jamie Teherani
Calculate the lattice constant as a function of position from a TEM through Fourier analysis.

ECE 695A Lecture 37: Radiation Induced Damage – An overview
20 Apr 2013   Contributor(s):: Muhammad Alam
Outline:Introduction and short history of radiation damageRadiation damage in various types of componentsSources of radiationA basic calculation and simulation approachesConclusions

ECE 695A Lecture 37R: Review Questions
20 Apr 2013   Contributor(s):: Muhammad Alam
Review Questions:Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET?What type of radiation issues could arise for thinbody devices like FINFET?What is error correction code? Why does it correct for MBU?What is the difference between SEE...

ECE 695A Lecture 33: Model Selection/Goodness of Fit
18 Apr 2013   Contributor(s):: Muhammad Alam
Outline:The problem of matching data with theoretical distributionParameter extractions: Moments, linear regression, maximum likelihoodGoodness of fit: Residual, Pearson, Cox, AkikaConclusion

ECE 695A Lecture 33R: Review Questions
18 Apr 2013   Contributor(s):: Muhammad Alam
Review Questions:With higher number of model parameters, you can always get a good fit – why should you minimize the number of parametersLeast square method is a subset of maximum likelihood approach to data fitting. Is this statement correct?What aspect of the distribution function does...

ECE 695A Lecture 32R: Review Questions
17 Apr 2013   Contributor(s):: Muhammad Alam
Review Questions:Why do people use Normal, lognormal, Weibull distributions when they do not know the exact physical distribution?What is the problem of using empirical distributions? What are the advantages?If you must choose an empirical distribution, what should be your criteria? (Nos. of...

ECE 695A Lecture 32: Physical vs. Empirical Distribution
17 Apr 2013   Contributor(s):: Muhammad Alam
Outline:Physical Vs. empirical distributionProperties of classical distribution functionMomentbased fitting of dataConclusions

ECE 695A Lecture 31R: Review Questions
15 Apr 2013   Contributor(s):: Muhammad Alam
Review Questions:What is the difference between parametric estimation vs. nonparametric estimation?What principle did Tacho Brahe’s approach assume?What is the difference between population and sample? When we collect data for TDDB or NBTI, what type of data are we collecting?What problem does...

ECE 695A Lecture 31: Collecting and Plotting Data
15 Apr 2013   Contributor(s):: Muhammad Alam
Outline:Origin of data, Field Acceleration vs. Statistical InferenceNonparametric informationPreparing data for projection: Hazen formula Preparing data for projection: Kaplan formulaConclusion

ECE 695A Lecture 31A: Appendix  Bootstrap Method Introduction
15 Apr 2013   Contributor(s):: Muhammad Alam

Exciton Dynamics Simulator
31 Dec 2012   Contributor(s):: Michael Heiber
Simulates the exciton dynamics in organic photovolatic devices

ECE 695A Lecture 30R: Review Questions
08 Apr 2013   Contributor(s):: Muhammad Alam
Outline:What is the difference between extrinsic vs. intrinsic breakdown?Does gas dielectric have extrinsic breakdown? Why or why not?What does ESD damage and the plasma damage to thin oxides?Can you explain the physical meaning of infant mortality ? How does it relate to yield of semiconductor...

ECE 695A Lecture 30: Breakdown in Dielectrics with Defects
08 Apr 2013   Contributor(s):: Muhammad Alam
Outline:IntroductionTheory of preexisting defects: Thin oxidesTheory of preexisting defects: thick oxidesConclusions