
Drift Diffusion  Temperature Sensor
16 Aug 2010  Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
The fact that mobility of a semiconductor varies with temperature is used to design a temperature sensor in this test.

Worked Examples for Carrier Statistics (basic)
16 Aug 2010  Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
Several worked out examples are presented that illustrate the basic concept of carrier concentration in semiconductors.

ABACUS: Test for MOSCAP Tool
16 Aug 2010  Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
The objective of this test is to give an idea to a selflearning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

Worked Examples for Carrier Statistics (advanced)
16 Aug 2010  Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
Two worked out examples based on FermiDirac Vs MaxwellBoltzmann statistics and temperature effects are presented.

Drift Diffusion Lab Worked out problems (Diffusion)
16 Aug 2010  Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
A sample problem is worked out using DriftDiffusion lab. The problem statement deals with the concept of diffusion in semiconductors.

ABACUS: Test for Drift Diffusion Lab
12 Aug 2010   Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
The objective of this test is to give an idea to a selflearning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

Verification of the Validity of the DriftDiffusion Lab Tool
11 Aug 2010   Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
DriftDiffusion Lab results are verified analytically. In the first test minority carrier concentration is computed in a semiconductor slab with constant carrier Generation rate (/cm3.s). In the second test bias is applied across a semiconductor slab and current is computed both analytically and...

Verification of the Validity of the MOSCap Tool
11 Aug 2010   Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
Numerical results for Surface Potential Vs Gate Bias are compared with analytical results to prove the validity of MOSCap Lab.

Carrier Statistics Tool Verification
10 Aug 2010   Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
This test verifies the Carrier Statistics Tool by comparing the numerically computed and analytically extracted, electron and hole carrier densities. The results are close within 2% of margin.

Verification of the Validity of Bulk Bandstructure Lab
10 Aug 2010   Contributor(s):: Dragica Vasileska, Gerhard Klimeck
This set of slides compares the optical gaps for Si, Ge and GaAs with those given in www.ioffe.ru, thus verifying the validity of the bulk Bandstructure Lab tool.

ABACUS: Test for Bandstructure Lab
10 Aug 2010   Contributor(s):: Dragica Vasileska, Gerhard Klimeck
This is a test that examines ones understanding of electronic structure once he/she has gone through the materials and exercises provided on the nanoHUB as part of the ABACUS Bandstructure topic page and running the Bandstructure Lab.

ABACUS: Test for Carrier Statistics Tool
10 Aug 2010   Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
The objective of this test is to give an idea to a selflearning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

Carrier Statistics  Temperature Effects
10 Aug 2010   Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck
Silicon (Si), Germanium (Ge) and GalliumArsenide (GaAs) are commonly used materials for MOS Field Effect Transistor (MOSFET) fabrication. MOSFET structures are commonly doped to achieve the desired switching operation and doping is a critical parameter in MOSFET designing.The goal in this test...

ABACUS: MOSFET  Diffusion Process
09 Aug 2010   Contributor(s):: Dragica Vasileska, Gerhard Klimeck
The goal of this assignment is to make familiar the students the required doses in the diffusion step of fabrication of semiconductor devices to get certain values of the volume doping densities.

ABACUS: Test for PN Junction Lab
09 Aug 2010   Contributor(s):: Dragica Vasileska, Gerhard Klimeck
The objective of this test is to give an idea to a selflearning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

Description of the K.P Method for Band Structure Calculation
05 Aug 2010   Contributor(s):: Dragica Vasileska
This set of slides describes the k.p mehod for band structure calculation.

ABACUS: Test for Crystal Viewer Tool
05 Aug 2010   Contributor(s):: Dragica Vasileska, Gerhard Klimeck
The objective of this test is to give an idea to a selflearning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

ABACUS: Test for Periodic Potential Lab
05 Aug 2010   Contributor(s):: Dragica Vasileska, Gerhard Klimeck
The objective of this test is to give an idea to a selflearning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

ABACUS: Test for PCPBT Lab
05 Aug 2010   Contributor(s):: Dragica Vasileska, Gerhard Klimeck
The objective of this test is to give an idea to a selflearning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

High Field Transport and the Monte Carlo Method for the Solution of the Boltzmann Transport Equation
23 Jul 2010   Contributor(s):: Dragica Vasileska
This set of slides first describes the pathintegral solution of the BTE and then discusses in details the Monte Carlo Method for the Solution of the Boltzmann Transport Equation.