Tags: nanoelectronics

Description

Progress in technology has brought microelectronics to the nanoscale, but nanoelectronics is not yet a well-defined engineering discipline with a coherent, experimentally verified, theoretical framework. The NCN has a vision for a new, 'bottom-up' approach to electronics, which involves: understanding electronic conduction at the atomistic level; formulating new simulation techniques; developing a new generation of software tools; and bringing this new understanding and perspective into the classroom. We address problems in atomistic phenomena, quantum transport, percolative transport in inhomogeneous media, reliability, and the connection of nanoelectronics to new problems such as biology, medicine, and energy. We work closely with experimentalists to understand nanoscale phenomena and to explore new device concepts. In the course of this work, we produce open source software tools and educational resources that we share with the community through the nanoHUB.

This page is a starting point for nanoHUB users interested in nanoelectronics. It lists key resources developed by the NCN Nanoelectronics team. The nanoHUB contains many more resources for nanoelectronics, and they can be located with the nanoHUB search function. To find all nanoelectronics resources, search for 'nanoelectronics.' To find those contributed by the NCN nanoelectronics team, search for 'NCNnanoelectronics.' More information on Nanoelectronics can be found here.

Teaching Materials (121-140 of 408)

  1. Drift Diffusion - Temperature Sensor

    16 Aug 2010 | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    The fact that mobility of a semiconductor varies with temperature is used to design a temperature sensor in this test.

  2. Worked Examples for Carrier Statistics (basic)

    16 Aug 2010 | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    Several worked out examples are presented that illustrate the basic concept of carrier concentration in semiconductors.

  3. ABACUS: Test for MOSCAP Tool

    16 Aug 2010 | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

  4. Worked Examples for Carrier Statistics (advanced)

    16 Aug 2010 | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    Two worked out examples based on Fermi-Dirac Vs Maxwell-Boltzmann statistics and temperature effects are presented.

  5. Drift Diffusion Lab Worked out problems (Diffusion)

    16 Aug 2010 | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    A sample problem is worked out using Drift-Diffusion lab. The problem statement deals with the concept of diffusion in semiconductors.

  6. ABACUS: Test for Drift Diffusion Lab

    12 Aug 2010 | | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

  7. Verification of the Validity of the Drift-Diffusion Lab Tool

    11 Aug 2010 | | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    Drift-Diffusion Lab results are verified analytically. In the first test minority carrier concentration is computed in a semiconductor slab with constant carrier Generation rate (/cm3.s). In the second test bias is applied across a semiconductor slab and current is computed both analytically and...

  8. Verification of the Validity of the MOSCap Tool

    11 Aug 2010 | | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    Numerical results for Surface Potential Vs Gate Bias are compared with analytical results to prove the validity of MOSCap Lab.

  9. Carrier Statistics Tool Verification

    10 Aug 2010 | | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    This test verifies the Carrier Statistics Tool by comparing the numerically computed and analytically extracted, electron and hole carrier densities. The results are close within 2% of margin.

  10. Verification of the Validity of Bulk Bandstructure Lab

    10 Aug 2010 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

    This set of slides compares the optical gaps for Si, Ge and GaAs with those given in www.ioffe.ru, thus verifying the validity of the bulk Bandstructure Lab tool.

  11. ABACUS: Test for Bandstructure Lab

    10 Aug 2010 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

    This is a test that examines ones understanding of electronic structure once he/she has gone through the materials and exercises provided on the nanoHUB as part of the ABACUS Bandstructure topic page and running the Bandstructure Lab.

  12. ABACUS: Test for Carrier Statistics Tool

    10 Aug 2010 | | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

  13. Carrier Statistics - Temperature Effects

    10 Aug 2010 | | Contributor(s):: Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

    Silicon (Si), Germanium (Ge) and Gallium-Arsenide (GaAs) are commonly used materials for MOS Field Effect Transistor (MOSFET) fabrication. MOSFET structures are commonly doped to achieve the desired switching operation and doping is a critical parameter in MOSFET designing.The goal in this test...

  14. ABACUS: MOSFET - Diffusion Process

    09 Aug 2010 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

    The goal of this assignment is to make familiar the students the required doses in the diffusion step of fabrication of semiconductor devices to get certain values of the volume doping densities.

  15. ABACUS: Test for PN Junction Lab

    09 Aug 2010 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

    The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

  16. Description of the K.P Method for Band Structure Calculation

    05 Aug 2010 | | Contributor(s):: Dragica Vasileska

    This set of slides describes the k.p mehod for band structure calculation.

  17. ABACUS: Test for Crystal Viewer Tool

    05 Aug 2010 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

    The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

  18. ABACUS: Test for Periodic Potential Lab

    05 Aug 2010 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

    The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

  19. ABACUS: Test for PCPBT Lab

    05 Aug 2010 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

    The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the...

  20. High Field Transport and the Monte Carlo Method for the Solution of the Boltzmann Transport Equation

    23 Jul 2010 | | Contributor(s):: Dragica Vasileska

    This set of slides first describes the path-integral solution of the BTE and then discusses in details the Monte Carlo Method for the Solution of the Boltzmann Transport Equation.