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Tags: nanoelectronics

Description

Progress in technology has brought microelectronics to the nanoscale, but nanoelectronics is not yet a well-defined engineering discipline with a coherent, experimentally verified, theoretical framework. The NCN has a vision for a new, 'bottom-up' approach to electronics, which involves: understanding electronic conduction at the atomistic level; formulating new simulation techniques; developing a new generation of software tools; and bringing this new understanding and perspective into the classroom. We address problems in atomistic phenomena, quantum transport, percolative transport in inhomogeneous media, reliability, and the connection of nanoelectronics to new problems such as biology, medicine, and energy. We work closely with experimentalists to understand nanoscale phenomena and to explore new device concepts. In the course of this work, we produce open source software tools and educational resources that we share with the community through the nanoHUB.

This page is a starting point for nanoHUB users interested in nanoelectronics. It lists key resources developed by the NCN Nanoelectronics team. The nanoHUB contains many more resources for nanoelectronics, and they can be located with the nanoHUB search function. To find all nanoelectronics resources, search for 'nanoelectronics.' To find those contributed by the NCN nanoelectronics team, search for 'NCNnanoelectronics.' More information on Nanoelectronics can be found here.

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  1. Guidelines for Writing NEEDS-certified Verilog-A Compact Models

    19 Jun 2013 | Online Presentations | Contributor(s): Tianshi Wang, Jaijeet Roychowdhury

    This talk contains a brief introduction to Verilog-A and suggests some initial guidelines for writing Verilog-A versions of NEEDS models. For more about the history of Verilog-A and additional...

    http://nanohub.org/resources/18621

  2. Introduction to Compact Models and Circuit Simulation

    19 Jun 2013 | Online Presentations | Contributor(s): Tianshi Wang, Jaijeet Roychowdhury

    The presentation is a gentle introduction to compact models, basic circuit simulation concepts, and flows for developing compact models. The roadmap for the NEEDS-SPICE platform, being developed...

    http://nanohub.org/resources/18616

  3. NEEDS Introduction

    19 Jun 2013 | Online Presentations | Contributor(s): Mark Lundstrom

    NEEDS is an initiative supported by the National Science Foundation and the Semiconductor Research Corporation with a mission to develop the critical missing link needed to transform...

    http://nanohub.org/resources/18626

  4. NEEDS Workshop on Compact Modeling

    19 Jun 2013 | Workshops | Contributor(s): Mark Lundstrom, Jaijeet Roychowdhury

    Advanced in research promise a new era of electronics – one that harnesses the capabilities of  novel  nano-­‐engineered  materials  and  devices  either  alone  or ...

    http://nanohub.org/resources/18630

  5. Verilog-A: Present Status and Guidelines

    19 Jun 2013 | Online Presentations | Contributor(s): Geoffrey Coram

    Verilog-A is the standard language for compact model development and implementation. This talk provides some background on the rationale for and development of Verilog-A, summarizes the current...

    http://nanohub.org/resources/18557

  6. nanoWind Installation files

    10 Jun 2013 | Downloads | Contributor(s): Tianwei Liu, Joseph M. Cychosz

    nanoWind is a Microsoft Office 2007 plugin designed to generate scripts for HUBpresenter using Final Cut XML, PowerPoint voice-narration or Adobe Presenter Project(aka. Breeze).

    http://nanohub.org/resources/13220

  7. TEM Lattice Calculator

    13 Mar 2013 | Tools | Contributor(s): Jamie Teherani

    Calculate the lattice constant as a function of position from a TEM through Fourier analysis.

    http://nanohub.org/resources/temlattice

  8. Karthikeyan K

    http://nanohub.org/members/81523

  9. ECE 695A Lecture 37: Radiation Induced Damage – An overview

    20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction and short history of radiation damage Radiation damage in various types of components Sources of radiation A basic calculation and simulation...

    http://nanohub.org/resources/17638

  10. ECE 695A Lecture 37R: Review Questions

    20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET? What type of radiation issues could arise for thin-body...

    http://nanohub.org/resources/17639

  11. ECE 695A Lecture 33: Model Selection/Goodness of Fit

    18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: The problem of matching data with theoretical distribution Parameter extractions: Moments, linear regression, maximum likelihood Goodness of fit: Residual, Pearson, Cox,...

    http://nanohub.org/resources/17615

  12. ECE 695A Lecture 33R: Review Questions

    18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: With higher number of model parameters, you can always get a good fit – why should you minimize the number of parameters Least square method is a subset of maximum...

    http://nanohub.org/resources/17616

  13. ECE 695A Lecture 32R: Review Questions

    17 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why do people use Normal, log-normal, Weibull distributions when they do not know the exact physical distribution? What is the problem of using empirical distributions?...

    http://nanohub.org/resources/17586

  14. ECE 695A Lecture 32: Physical vs. Empirical Distribution

    17 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Physical Vs. empirical distribution Properties of classical distribution function Moment-based fitting of data Conclusions

    http://nanohub.org/resources/17585

  15. ECE 695A Lecture 31R: Review Questions

    15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is the difference between parametric estimation vs. non-parametric estimation? What principle did Tacho Brahe’s approach assume? What is the difference between...

    http://nanohub.org/resources/17584

  16. ECE 695A Lecture 31: Collecting and Plotting Data

    15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Origin of data, Field Acceleration vs. Statistical Inference Nonparametric information Preparing data for projection: Hazen formula Preparing data for projection: Kaplan...

    http://nanohub.org/resources/17582

  17. ECE 695A Lecture 31A: Appendix - Bootstrap Method Introduction

    15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17583

  18. Exciton Dynamics Simulator

    31 Dec 2012 | Tools | Contributor(s): Michael Heiber

    Simulates the exciton dynamics in organic photovolatic devices

    http://nanohub.org/resources/exdynamics

  19. ECE 695A Lecture 30R: Review Questions

    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: What is the difference between extrinsic vs. intrinsic breakdown? Does gas dielectric have extrinsic breakdown? Why or why not? What does ESD damage and the plasma damage to thin...

    http://nanohub.org/resources/17487

  20. ECE 695A Lecture 30: Breakdown in Dielectrics with Defects

    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction Theory of pre-existing defects: Thin oxides Theory of pre-existing defects: thick oxides Conclusions

    http://nanohub.org/resources/17486

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.