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Atomic Force Microscope Investigations of Lubrication Layers
26 Nov 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...