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ECE 695A Lecture 13R: Review Questions
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
Both SiH and SiO are involved in HCI degradation. Give two evidences.
Why doesn’t HCI occur during NBTI stress condition?
I suggested that HCI curve can shifted...
http://nanohub.org/resources/16888
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ECE 695A Lecture 5R: Review Questions
12 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
What is the difference between coordination and composition?
Is periodicity essential for a defect-free structure?
Why can’t the amorphous material have arbitrary ring...
http://nanohub.org/resources/16788
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ECE 695A Lecture 11R: Review Questions
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
Does Einstein relationship hold for activated diffusion?
People argue that the forward dissociation and reverse passivation have similar activation barriers. Would you...
http://nanohub.org/resources/16786
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ECE 695A Lecture 10A: Appendix - Reflection on R-D Equation
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
http://nanohub.org/resources/16787
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ECE 695A Lecture 12: Field Dependence of NBTI
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Background: Field dependent degradation
Components of field-dependent dissociation:
Interpreting experiments
Voltage acceleration factors
Conclusion
http://nanohub.org/resources/16789
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ECE 695A Lecture 12R: Review Questions
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
Explain the difference between local field and global field within an oxide.
Explain physically why electric field decreases bond strength.
How does the dissociation...
http://nanohub.org/resources/16790
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ECE 695A Lecture 9R: Review Questions
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
Does NBTI power-exponent depend on voltage or temperature?
Do you expect the NBTI power-exponent to be larger or smaller if trapping is important?
How does one know that...
http://nanohub.org/resources/16778
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ECE 695A Lecture 11: Temperature Dependence of NBTI
07 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Review: Temperature activation & NBTI
Temperature dependent forward/reverse rates
Temperature dependence of diffusion coefficient
Material dependence of activation...
http://nanohub.org/resources/16774
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ECE 695A Lecture 10: NBTI Time Dependence -- Frequency and Duty Cycle Dependencies
06 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
NBTI stress and relaxation by R-D model
Frequency independence and lifetime projection
Duty cycle dependence
The magic of measurement
Conclusions
http://nanohub.org/resources/16668
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ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase
06 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Background: Time-dependent degradation
The Reaction-Diffusion model
Approximate solution to R-D model in stress phase
Degradation free transistors
Conclusions
http://nanohub.org/resources/16667
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ECE 695A Lecture 6: Defects in the Bulk and at Interfaces
01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Strain in materials/origin of defects
Examples: bulk defects
Examples: interface defects
Measurements
Conclusions
http://nanohub.org/resources/16608
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ECE 695A Lecture 8: Phenomenological Observations for NBTI
01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Qualitative observations
Time, voltage, temperature dependencies
Material dependence
Circuit implications
http://nanohub.org/resources/16665
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ECE 695A Lecture 8R: Review Questions
01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
What is the distinction between BTI and NBTI phenomena?
What does it mean that a process is thermally activated?
What is the difference between parametric failure and catastrophic failure?...
http://nanohub.org/resources/16666
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ECE 695A Lecture 7: Trapping in Pre-existing Traps
29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Pre-existing vs. stress-induced traps
Voltage-shift in pre-existing bulk/interface traps
Random Telegraph Noise, 1/f noise
Conclusion
http://nanohub.org/resources/16609
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ECE 695A Lecture 7A: Appendix - Theory of Stochastic Distribution
29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam
Supplemental information for Lecture 7: Trapping in Pre-existing Traps
http://nanohub.org/resources/16611
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ECE 695A Lecture 7R: Review Questions
29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
Why are there more types of defects in crystals than in amorphous material?
From the perspective of Maxwell’s relation, how does H reduce defect density?
Why is HfO2 so...
http://nanohub.org/resources/16615
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ECE 695A Lecture 1: Reliability of Nanoelectronic Devices
11 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Evolving Landscape of Electronics
Performance, Variability, and Reliability
Classification of Reliability
Course Information
Conclusions
http://nanohub.org/resources/16511
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ECE 606 Lecture 25: Modern MOSFETs
03 Dec 2012 | Online Presentations | Contributor(s): Gerhard Klimeck
http://nanohub.org/resources/16055
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nanoHUB-U NT Nanoscale Transistors: Scientific Overview
03 Aug 2012 | Online Presentations | Contributor(s): Mark Lundstrom
For details see http://nanohub.org/u
Nanoscale Transistors has been refined and condensed into a five-week online course that develops a unified framework for understanding essentials of...
http://nanohub.org/resources/14923
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Nanoscale Transistors: Scientific Overview
19 Jul 2012 | Online Presentations | Contributor(s): Mark Lundstrom
http://nanohub.org/resources/14759