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Modeling Interface-defect Generation (MIG)
4.0 out of 5 stars
28 Aug 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam
Analyzes device reliability based on NBTI
5.0 out of 5 stars
14 Aug 2005 | Tools | Contributor(s): Michael McLennan
General-purpose circuit simulation program for nonlinear dc, nonlinear transient, and linear ac analysis