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Modeling Interface-defect Generation (MIG)
Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›
18 Jul 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam
Analyzes device reliability based on NBTI
https://nanohub.org/resources/devrel
Spice3f4
14 Aug 2005 | Tools | Contributor(s): Michael McLennan
General-purpose circuit simulation program for nonlinear dc, nonlinear transient, and linear ac analysis
https://nanohub.org/resources/spice3f4
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