Tags: NBTI

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  1. ECE 695A Lecture 8R: Review Questions

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    What is the distinction between BTI and NBTI phenomena? What does it mean that a process is thermally activated? What is the difference between parametric failure and catastrophic failure?...

    http://nanohub.org/resources/16666

  2. Siting Liu

    http://nanohub.org/members/60600

  3. Esteve Amat

    http://nanohub.org/members/52897

  4. On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory

    30 Dec 2009 | Online Presentations | Contributor(s): Ahmad Ehteshamul Islam, Souvik Mahapatra, Muhammad A. Alam

    Reaction-Diffusion (R-D) theory, well-known to successfully explain most features of NBTI stress, is perceived to fail in explaining NBTI recovery. Several efforts have been made to understand...

    http://nanohub.org/resources/8023

  5. Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices

    01 Jul 2008 | Online Presentations | Contributor(s): Ahmad Ehteshamul Islam, Souvik Mahapatra, Muhammad A. Alam

    Mobility degradation due to generation of interface traps, Δµeff(NIT), is a well-known phenomenon that has been theoretically interpreted by several mobility models. Based on these analysis, there...

    http://nanohub.org/resources/4835

  6. Modeling Interface-defect Generation (MIG)

    28 Aug 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam

    Analyzes device reliability based on NBTI

    http://nanohub.org/resources/devrel

  7. Ahmad Ehteshamul Islam

    Ahmad Ehteshamul Islam is a Research Scientist at Soft Matter Materials Branch in Materials and Manufacturing Directorate of Air Force Research Laboratory, Dayton, Ohio. He obtained Ph.D. degree...

    http://nanohub.org/members/9615

  8. Spice3f4

    14 Aug 2005 | Tools | Contributor(s): Michael McLennan

    General-purpose circuit simulation program for nonlinear dc, nonlinear transient, and linear ac analysis

    http://nanohub.org/resources/spice3f4

  9. Negative Bias Temperature Instability (NBTI)

    22 Nov 2016

    In this modular course, we will cover recent advances in Negative Bias Temperature Instability (NBTI), which is a crucial reliability issue for Silicon Oxynitride and High K Metal Gate PMOS...

    http://nanohub.org/courses/NBTI