Tags: NBTI

All Categories (21-27 of 27)

  1. Siting Liu

    http://nanohub.org/members/60600

  2. Esteve Amat

    http://nanohub.org/members/52897

  3. On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory

    30 Dec 2009 | Online Presentations | Contributor(s): Ahmad Ehteshamul Islam, Souvik Mahapatra, Muhammad A. Alam

    Reaction-Diffusion (R-D) theory, well-known to successfully explain most features of NBTI stress, is perceived to fail in explaining NBTI recovery. Several efforts have been made to understand...

    http://nanohub.org/resources/8023

  4. Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices

    01 Jul 2008 | Online Presentations | Contributor(s): Ahmad Ehteshamul Islam, Souvik Mahapatra, Muhammad A. Alam

    Mobility degradation due to generation of interface traps, Δµeff(NIT), is a well-known phenomenon that has been theoretically interpreted by several mobility models. Based on these analysis,...

    http://nanohub.org/resources/4835

  5. Modeling Interface-defect Generation (MIG)

    28 Aug 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam

    Analyzes device reliability based on NBTI

    http://nanohub.org/resources/devrel

  6. Ahmad Ehteshamul Islam

    Ahmad Ehteshamul Islam is a Research Scientist at Soft Matter Materials Branch in Materials and Manufacturing Directorate of Air Force Research Laboratory, Dayton, Ohio. He obtained Ph.D. degree...

    http://nanohub.org/members/9615

  7. Spice3f4

    14 Aug 2005 | Tools | Contributor(s): Michael McLennan

    General-purpose circuit simulation program for nonlinear dc, nonlinear transient, and linear ac analysis

    http://nanohub.org/resources/spice3f4