Tags: NBTI

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  1. ECE 695A Lecture 8: Phenomenological Observations for NBTI

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Qualitative observations Time, voltage, temperature dependencies Material dependence Circuit implications

    http://nanohub.org/resources/16665

  2. ECE 695A Lecture 8R: Review Questions

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    What is the distinction between BTI and NBTI phenomena? What does it mean that a process is thermally activated? What is the difference between parametric failure and catastrophic failure?...

    http://nanohub.org/resources/16666

  3. Siting Liu

    http://nanohub.org/members/60600

  4. Esteve Amat

    http://nanohub.org/members/52897

  5. On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory

    30 Dec 2009 | Online Presentations | Contributor(s): Ahmad Ehteshamul Islam, Souvik Mahapatra, Muhammad A. Alam

    Reaction-Diffusion (R-D) theory, well-known to successfully explain most features of NBTI stress, is perceived to fail in explaining NBTI recovery. Several efforts have been made to understand...

    http://nanohub.org/resources/8023

  6. Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices

    01 Jul 2008 | Online Presentations | Contributor(s): Ahmad Ehteshamul Islam, Souvik Mahapatra, Muhammad A. Alam

    Mobility degradation due to generation of interface traps, Δµeff(NIT), is a well-known phenomenon that has been theoretically interpreted by several mobility models. Based on these analysis, there...

    http://nanohub.org/resources/4835

  7. Modeling Interface-defect Generation (MIG)

    28 Aug 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam

    Analyzes device reliability based on NBTI

    http://nanohub.org/resources/devrel

  8. Ahmad Ehteshamul Islam

    Ahmad Ehteshamul Islam is currently a Research Scientist at UES, Inc. and is working in the Soft Matter Branch in Materials and Manufacturing Directorate (RXAS), Air Force Research Laboratory...

    http://nanohub.org/members/9615

  9. Spice3f4

    14 Aug 2005 | Tools | Contributor(s): Michael McLennan

    General-purpose circuit simulation program for nonlinear dc, nonlinear transient, and linear ac analysis

    http://nanohub.org/resources/spice3f4

  10. Negative Bias Temperature Instability (NBTI)

    22 Nov 2016

    In this modular course, we will cover recent advances in Negative Bias Temperature Instability (NBTI), which is a crucial reliability issue for Silicon Oxynitride and High K Metal Gate PMOS...

    http://nanohub.org/courses/NBTI