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ECE 695A Lecture 7: Trapping in Pre-existing Traps
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29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Pre-existing vs. stress-induced traps Voltage-shift in pre-existing bulk/interface traps Random Telegraph Noise, 1/f noise Conclusion
Atomistic Simulations of Reliability
06 Jul 2010 | Teaching Materials | Contributor(s): Dragica Vasileska
Discrete impurity effects in terms of their statistical variations in number and position in the inversion and depletion region of a MOSFET, as the gate length is aggressively scaled, have recently …
Research Within Vasileska Group
29 Jun 2010 | Online Presentations | Contributor(s): Dragica Vasileska
This presentation outlines recent progress in reseach within Vasileska group in the area of random telegraph noise and thermal modeling, and modeling of GaN HEMTs.
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