ECE 695A Lecture 7: Trapping in Pre-existing Traps

29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

Outline: Pre-existing vs. stress-induced traps Voltage-shift in pre-existing bulk/interface traps Random Telegraph Noise, 1/f noise Conclusion

https://nanohub.org/resources/16609

Atomistic Simulations of Reliability

06 Jul 2010 | Teaching Materials | Contributor(s): Dragica Vasileska

Discrete impurity effects in terms of their statistical variations in number and position in the inversion and depletion region of a MOSFET, as the gate length is aggressively scaled, have recently …

https://nanohub.org/resources/9253

Research Within Vasileska Group

29 Jun 2010 | Online Presentations | Contributor(s): Dragica Vasileska

This presentation outlines recent progress in reseach within Vasileska group in the area of random telegraph noise and thermal modeling, and modeling of GaN HEMTs.

https://nanohub.org/resources/9235