ECE 695A Reliability Physics of Nanotransistors

17 Jan 2013 | Courses | Contributor(s): Muhammad Alam

This course will focus on the physics of reliability of small semiconductor devices. In traditional courses on device physics, the students learn how to compute current through a device when a …

https://nanohub.org/resources/16560

Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

28 Mar 2012 | Courses | Contributor(s): Souvik Mahapatra

This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has …

https://nanohub.org/resources/13613

Nanostructured Electronic Devices: Percolation and Reliability

17 Sep 2009 | Courses | Contributor(s): Muhammad A. Alam

In this series of lectures introduces a simple theoretical framework for treating randomness and variability in emerging nanostructured electronic devices for wide ranging applications – all within …

https://nanohub.org/resources/7168

Reliability Physics of Nanoscale Transistors

27 Nov 2007 | Courses | Contributor(s): Muhammad A. Alam

This course will focus on the physics of reliability of small semiconductor devices. In traditional courses on device physics, we learn how to compute current through a device when a voltage is …

https://nanohub.org/resources/3587